Search

Joe C Wang

from Rowland Heights, CA
Age ~42
Get Report
Also known as:
Joe Chun Wang, Joe Wei Wang, Chunwei Wang, Wei Wang Chun, Joe Chun, Joechu Weiwang, N Weiwang
Related to:
John J Wang, 70
Connected to:
Aaron Wang, 36Aijie Wang, 54Ailin Y Wang, 67Aiying Wang, 63Alex F Wang, 51Alexandra Wang, 50Alfred C Wang, 47Ally H Wang, 50Amerfil M Wang, 80Andreas Wang, 28

Joe Wang Phones & Addresses

  • Rowland Heights, CA
  • Los Altos, CA
  • Monrovia, CA
  • 305 Hendrix Rd, West Henrietta, NY 14586
  • 103 Murphy Pl, West Henrietta, NY 14586
  • 1844 Crittenden Rd #8, Rochester, NY 14623
  • 196 E Squire Dr, Rochester, NY 14623 (585) 292-9573
  • Roswell, GA
  • Rowland Heights, CA

Resumes

Resumes

Joe Wang Photo 1

Joe Wang Sandy, UT

View page
Work:
Green River Capital
West Valley City, UT
Jan 2014 to Feb 2014
Data Entry specialist/Pre-marketing (temp)
Monster Bowl
La Jolla, CA
Sep 2011 to Jun 2012
Programming Co-Chair
Mount San Antonio College
Walnut, CA
Jun 2010 to May 2011
Math Tutor/ Supplement Instructor
Bestbuy
Murray, UT
Aug 2007 to Jan 2009
Sales Associate
Kowloon Cafe
West Valley City, UT
Jun 2006 to Jan 2008
Assistant Manager
Education:
University of California
La Jolla, CA
Jun 2013
Bachelor in Science
Mount San Antonio College
Walnut, CA
Aug 2009 to May 2011
General Education & Transfer Studies

Business Records

Name / Title
Company / Classification
Phones & Addresses
Joe Wang
Human Resource Manager
E O H Realty Inc
Real Estate Agents and Managers
1355 Nogales St, City of Industry, CA 91748
Joe Wang
Human Resources Executive
Foria International, Inc.
Men's and Boy's Clothing and Furnishings
18689 Arenth Ave, Whittier, CA 91748
Joe Wang
Transportation Engineer Supervisor
City of Oakland - Records Management
Executive Offices
1 Frank H Ogawa Plz 2Nd, Oakland, CA 94612
Joe Wang
Manager
Buddhist Tzu- Chi Free Clinic
1000 S Garfield Ave, Alhambra, CA 91801
Joe Wang
Manager
Flower Connection
Eating Places
260 The Plaza Pasadena, Pasadena, CA
Joe Wang
Allstar Brokers Network
Real Estate Agents and Managers
850 E Las Tunas Dr, San Gabriel, CA 91776
Joe Wang
Founder
Wang, Joe
Job Training and Vocational Rehabilitation Se...
6303 E. Cedarbrooks Rd., Orange, CA 92867
Joe Wang
Owner
Joe Wang Carpet & Flooring
Floor Laying. Refinishing & Resurfacing
116A Starlite St, South San Francisco, CA 94080
(650) 636-1508, (650) 636-1511
Joe Wang
Human Resource Manager
E O H Realty Inc
Real Estate Agents and Managers
1355 Nogales St, City of Industry, CA 91748
Joe Wang
Human Resources Executive
Foria International, Inc.
Men's and Boy's Clothing and Furnishings
18689 Arenth Ave, Whittier, CA 91748
Joe Wang
Transportation Engineer Supervisor
City of Oakland - Records Management
Executive Offices
1 Frank H Ogawa Plz 2Nd, Oakland, CA 94612
Joe Wang
Manager
Buddhist Tzu- Chi Free Clinic
1000 S Garfield Ave, Alhambra, CA 91801
Joe Wang
Manager
Flower Connection
Eating Places
260 The Plaza Pasadena, Pasadena, CA
Joe Wang
Allstar Brokers Network
Real Estate Agents and Managers
850 E Las Tunas Dr, San Gabriel, CA 91776
Joe Wang
Founder
Wang, Joe
Job Training and Vocational Rehabilitation Se...
6303 E. Cedarbrooks Rd., Orange, CA 92867

Publications

Us Patents

System And Method For Bare Wafer Inspection

View page
US Patent:
20200027693, Jan 23, 2020
Filed:
Jul 19, 2019
Appl. No.:
16/517390
Inventors:
- AH Veldhoven, NL
Joe Wang - Campbell CA, US
International Classification:
H01J 37/22
G01N 21/95
G01N 21/956
H01J 37/28
H01J 37/14
H01J 37/147
H01J 37/244
Abstract:
A wafer inspection system includes a controller in communication with an electron-beam inspection tool. The controller includes circuitry to: acquire, via an optical imaging tool, coordinates of defects on a sample; set a Field of View (FoV) of the electron-beam inspection tool to a first size to locate a subset of the defects; determine a position of each defect of the subset of the defects based on inspection data generated by the electron-beam inspection tool during a scanning of the sample; adjust the coordinates of the defects based on the determined positions of the subset of the defects; and set the FoV of the electron-beam inspection tool to a second size to locate additional defects based on the adjusted coordinates.

Energy Filter For Charged Particle Beam Apparatus

View page
US Patent:
20160035533, Feb 4, 2016
Filed:
Jul 15, 2015
Appl. No.:
14/800098
Inventors:
- Hsinchu City, TW
Joe Wang - Campbell CA, US
Shuai Li - Beijing, CN
Zhongwei Chen - San Jose CA, US
International Classification:
H01J 37/05
H01J 37/28
H01J 37/10
Abstract:
This invention provides two methods for improving performance of an energy-discrimination detection device with an energy filter of reflective type for a charged particle beam. The first method employs a beam-adjusting means to improve the energy-discrimination power, and the second method uses an electron-multiplication means to enhance the image signal without noise raise. A LVSEM with such an improved energy-discrimination detection device can provide variant high-contrast images of interested features on a specimen surface for multiple application purposes.
Control profile
Joe C Wang from Rowland Heights, CA, age ~42 Get Report