Jingjing C Zhang

8468471, Jun 18, 2013

Mar 2, 2012

13/411433

Xuefeng Liu - San Jose CA, US
Yung-Ho Alex Chuang - Cupertino CA, US
John Fielden - Los Altos CA, US
Jingjing Zhang - San Jose CA, US

KLA-Tencor Corp. - Milpitas CA

G06F 19/00
G06F 17/50

716 54, 716 52, 716 53, 716 55, 716136, 700110, 700120, 700121

Systems and methods for process aware metrology are provided.

20130045012, Feb 21, 2013

Aug 17, 2012

13/588335

Konstantinos Kanonakis - Athens, GR
Neda Cvijetic - Plainsboro NJ, US
Jingjing Zhang - San Jose CA, US
Ting Wang - West Windsor NJ, US

NEC LABORATORIES AMERICA, INC. - Princeton NJ

H04J 14/00

398 66

A method for multi-service provisioning in an OFDMA-PON that includes linking communicatively to a core network and bandwidth provisioning, dynamically within a single wavelength, traffic from the core network to a network of multiple virtual passive optical networks VPONs for multi-service provisioning to the VPONs.

20130282340, Oct 24, 2013

Jun 17, 2013

13/919577

Yung-Ho Alex Chuang - Cupertino CA, US
John Fielden - Los Altos CA, US
Jingjing Zhang - San Jose CA, US

G06F 17/50

703 1

Systems and methods for process aware metrology are provided. One method includes selecting nominal values and one or more different values of process parameters for one or more process steps used to form the structure on the wafer, simulating one or more characteristics of the structure that would be formed on the wafer using the nominal values, and determining parameterization of the optical model based on how the one or more characteristics of the structure vary between at least two of the nominal values and the one or more different values.

20220188849, Jun 16, 2022

Mar 2, 2022

17/684483

- San Francisco CA, US
Tanya Soluk - San Carlos CA, US
Qingyuan Zhang - Los Altos CA, US
Jingjing Zhang - Redwood City CA, US
Bingxin Mao - Shanghai, CN
Jiaqi Xu - Foster City CA, US
Linjun Chen - San Jose CA, US

G06Q 30/02
G06F 16/245
G06Q 40/02
G06N 5/04

Provided is a method including determining a combined plurality of accounts, determining, for each account of the combined plurality of accounts, aggregate transaction data associated with a plurality of transactions involving the account; determining a first cohort level group including a group of exposed accounts and controls accounts; determining a first segment level group of accounts from the first cohort level group of accounts; generating a prediction model based on a plurality of control accounts that are included in the first segment level group of accounts; identifying a first exposed account of a plurality of exposed accounts; determining a first control account of the plurality of control accounts that corresponds to a first exposed account using the prediction model; and outputting a report comprising data associated with the first control account that corresponds to the first exposed account. Systems and computer program products are also provided.

20200412823, Dec 31, 2020

Sep 14, 2020

17/020431

- Plano TX, US
Jingjing Zhang - Plano TX, US

H04L 29/08
G06F 9/46
G06F 9/00

A telecommunications edge cloud (TEC) element comprising a plurality of TEC hardware components comprising a computing component that includes one or more processors, a storage component that includes a memory, a networking component, with the TEC device being deployed between a client and a packet network, the computing component being configured to manage a computing resource in the computing component, a networking resource in the networking component, and a storage resource in the storage component, allocate the computing resource for a first application of the plurality of different applications, execute the first application using the computing resource, allocate the networking resource for a second application of the plurality of different applications, execute the second application using the networking resource, allocate the storage resource for a third application of the plurality of different applications, execute the third application using the storage resource.

20200294072, Sep 17, 2020

Mar 16, 2020

16/820074

- San Francisco CA, US
Tanya Soluk - San Carlos CA, US
Qingyuan Zhang - Los Altos CA, US
Jingjing Zhang - Redwood City CA, US
Bingxin Mao - Shanghai, CN
Linjun Chen - San Jose CA, US
Jiaqi Xu - Foster City CA, US

G06Q 30/02
G06F 16/245
G06N 5/04
G06Q 40/02

Provided is a method including determining a combined plurality of accounts, determining, for each account of the combined plurality of accounts, aggregate transaction data associated with a plurality of transactions involving the account; determining a first cohort level group including a group of exposed accounts and controls accounts; determining a first segment level group of accounts from the first cohort level group of accounts; generating a prediction model based on a plurality of control accounts that are included in the first segment level group of accounts; identifying a first exposed account of a plurality of exposed accounts; determining a first control account of the plurality of control accounts that corresponds to a first exposed account using the prediction model; and outputting a report comprising data associated with the first control account that corresponds to the first exposed account. Systems and computer program products are also provided.

20200194476, Jun 18, 2020

Sep 5, 2019

16/562396

- Milpitas CA, US
John Fielden - Los Altos CA, US
Jingjing Zhang - San Jose CA, US
David L. Brown - Los Gatos CA, US
Sisir Yalamanchili - Milpitas CA, US

H01L 27/146
H01L 27/148

An image sensor utilizes a pure boron layer and a second epitaxial layer having a p-type dopant concentration gradient to enhance sensing DUV, VUV or EUV radiation. Sensing (circuit) elements and associated metal interconnects are fabricated on an upper surface of a first epitaxial layer, then the second epitaxial layer is formed on a lower surface of the first epitaxial layer, and then a pure boron layer is formed on the second epitaxial layer. The p-type dopant concentration gradient is generated by systematically increasing a concentration of p-type dopant in the gas used during deposition/growth of the second epitaxial layer such that a lowest p-type dopant concentration of the second epitaxial layer occurs immediately adjacent to the interface with the first epitaxial layer, and such that a highest p-type dopant concentration of the second epitaxial layer occurs immediately adjacent to the interface with pure boron layer.

20190313044, Oct 10, 2019

Jun 12, 2019

16/439297

- Milpitas CA, US
Jingjing Zhang - San Jose CA, US
Sharon Zamek - Sunnyvale CA, US
John Fielden - Los Altos CA, US
Devis Contarato - San Carlos CA, US
David L. Brown - Los Gatos CA, US

H04N 5/378
G01N 21/956
H04N 5/361
H04N 5/372
G06T 7/00
H01L 27/148
G01N 21/95

A multiple-column-per-channel image CCD sensor utilizes a multiple-column-per-channel readout circuit including connected transfer gates that alternately transfer pixel data (charges) from a group of adjacent pixel columns to a shared output circuit at high speed with low noise. Charges transferred along the adjacent pixel columns at a line clock rate are alternately passed by the transfer gates to a summing gate that is operated at multiple times the line clock rate to pass the image charges to the shared output circuit. A symmetrical fork-shaped diffusion is utilized in one embodiment to merge the image charges from the group of related pixel columns. A method of driving the multiple-column-per-channel CCD sensor with line clock synchronization is also described. A method of inspecting a sample using the multiple-column-per-channel CCD sensor is also described.