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Jerome C Porque

from Lebanon, NJ
Age ~55
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Also known as:
Jerome E
Related to:
Sandrine Porque, 56
Connected to:
Craig B Porr, 46Erin L Porr, 51George H Porr, 98James D Porr, 52John Porr, 54Kathy S Porr, 67Troy M Porr, 57Waldo S Porr, 65Dana Porraro, 89Matthew L Porraro, 67

Jerome Porque Phones & Addresses

  • Lebanon, NJ
  • 225 Hancock Ave, Bridgewater, NJ 08807 (908) 704-6984
  • 10320 Boulder Ln, Austin, TX 78726 (512) 257-2504
  • 11266 Taylor Draper Cv, Austin, TX 78759 (512) 342-0261
  • 8107 Tallyho Trl, Austin, TX 78729 (512) 219-0872 (512) 342-0261
  • 11500 Jollyville Rd, Austin, TX 78759
  • Tucson, AZ

Work

Company: Ofs Sep 2011 Position: Member of the technical staff

Education

Degree: Ph.D. School / High School: Université des Sciences et Techniques du Languedoc (Montpellier II) 1995 to 1998 Specialities: Electronics/Optics

Skills

Optics

Industries

Research

Resumes

Resumes

Jerome Porque Photo 1

Member Of The Technical Staff At Ofs Fitel Llc

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Position:
Member of The Technical Staff at OFS
Location:
Greater New York City Area
Industry:
Research
Work:
OFS since Sep 2011
Member of The Technical Staff
OFS - Somerset, NJ Apr 2008 - Aug 2010
Member of the technical staff
3M 2004 - 2008
Research Specialist - Austin, TX
3M 2000 - 2004
Senior Research Scientist- Austin, TX
The University of Arizona 1999 - 2000
Research Associate - Tucson, AZ
Education:
Université des Sciences et Techniques du Languedoc (Montpellier II) 1995 - 1998
Ph.D., Electronics/Optics
Skills:
Optics

Publications

Us Patents

Fabrication Of Structures In An Optical Substrate

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US Patent:
7085450, Aug 1, 2006
Filed:
Dec 22, 2004
Appl. No.:
11/020894
Inventors:
Levent Biyikli - Cedar Park TX, US
Jerome C. Porque - Austin TX, US
James M. Battiato - Austin TX, US
David B. Stegall - Austin TX, US
Assignee:
3M Innovative Properties Company - St. Paul MN
International Classification:
G02B 6/34
G03C 5/00
C03B 37/022
C03B 37/023
C03B 37/018
US Classification:
385 37, 430321, 65385, 65386, 65392
Abstract:
A system and method for fabricating structures in an optical substrate. An optical element produces first and second write beams that intersect at a first intersection location at the optical substrate. The first intersection location includes a fringe pattern produced by the first and second write beams. The optical element also produces first and second reference beams that intersect and are recombined at a second intersection location in substantially the same plane as the first intersection location. A controller then controls relative positioning between the optical substrate and the fringe pattern based on a signal derived from the recombined first and second reference beams.

Method And System For Fabricating Three-Dimensional Structures With Sub-Micron And Micron Features

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US Patent:
8071277, Dec 6, 2011
Filed:
Dec 1, 2008
Appl. No.:
12/325659
Inventors:
Jerome C. Porque - Bridgewater NJ, US
Assignee:
3M Innovative Properties Company - St. Paul MN
International Classification:
G03F 7/26
US Classification:
430325
Abstract:
A method and system are provided for fabricating three-dimensional (3D) structures having micron or submicron features. The method includes providing a continuously-formed relief structured material, the relief structured material having a first layer comprising a material having a pattern of relief structures formed on a first surface thereof. The structured material includes second layer comprising a photosensitive material that is disposed on the first layer. The relief structured material is exposed to radiation through the first layer, where the pattern of relief structures formed on the first surface of the first layer generates a 3-dimensional light intensity pattern of the radiation that is incident on the second layer. The exposed material is developed, where the developed material comprises a plurality of 3D structures having micron or submicron features.

Method Of Making Microarrays

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US Patent:
8115920, Feb 14, 2012
Filed:
Oct 7, 2008
Appl. No.:
12/246514
Inventors:
Jun-Ying Zhang - Woodbury MN, US
Terry L. Smith - Roseville MN, US
Haiyan Zhang - Woodbury MN, US
Jerome C. Porque - Bridgewater NJ, US
Ding Wang - Austin TX, US
John C. Hulteen - Afton MN, US
Lisa A. Dick - Afton MN, US
Assignee:
3M Innovative Properties Company - St. Paul MN
International Classification:
G01J 3/44
G01N 21/65
US Classification:
356301
Abstract:
Provided is a method of making microarrays that includes providing a substrate with discrete first microfeatures that have a first profile, and depositing vapor-coated materials onto the first microfeatures to form second microfeatures having a second profile that is substantially different from the first profile. Also provided is a method of adding a replication material to the vapor-coated microfeatures to form a mold. Microarrays made by this method can be used as substrates for surface-enhanced Raman spectroscopy (SERS).

Quality Review Method For Optical Components Using A Fast System Performance Characterization

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US Patent:
20030053070, Mar 20, 2003
Filed:
Jun 28, 2002
Appl. No.:
10/185979
Inventors:
Xudong Fan - Austin TX, US
James Brennan - Austin TX, US
Michael Matthews - Austin TX, US
Pranay Sinha - Austin TX, US
Jerome Porque - Austin TX, US
Assignee:
3M Innovative Properties Company
International Classification:
G01B009/02
US Classification:
356/477000
Abstract:
A method for screening the quality of an optical component including the step of simulating the performance of the optical component. The step of simulating includes the step of measuring the optical phase of the optical component, wherein the step of measuring comprises indirectly measuring the optical phase of the optical component using a scanning laser having a scanning step size and a modulation frequency such that /2. The light throughput R of the optical component is then measured. A transfer function H as a function of optical frequency is constructed where H()=R()exp[j ()], and the performance is simulated using the measured value of the optical phase and the light throughput into the transfer function.

Quality Review Method For Optical Components Using A Fast System Performance Characterization

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US Patent:
20030063286, Apr 3, 2003
Filed:
Sep 9, 2002
Appl. No.:
10/237325
Inventors:
Xudong Fan - Austin TX, US
James Brennan - Austin TX, US
Michael Matthews - Austin TX, US
Pranay Sinha - Columbia MD, US
Jerome Porque - Austin TX, US
International Classification:
G01B009/02
US Classification:
356/477000
Abstract:
A method for screening the quality of an optical component including the step of simulating the performance of the optical component. The step of simulating includes the step of measuring the optical phase of the optical component, wherein the step of measuring comprises indirectly measuring the optical phase of the optical component using a scanning laser having a scanning step size and a modulation frequency such that /. The light throughput R of the optical component is then measured. A transfer function H as a function of optical frequency co is constructed where H()=R()exp[j ()], and the performance is simulated using the measured value of the optical phase and the light throughput into the transfer function.

Lensed Fiber Array For Sub-Micron Optical Lithography Patterning

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US Patent:
20060134535, Jun 22, 2006
Filed:
Dec 22, 2004
Appl. No.:
11/020864
Inventors:
Jerome Porque - Austin TX, US
International Classification:
G03B 27/00
G03F 9/00
G03C 5/00
US Classification:
430030000, 355018000, 430022000
Abstract:
In accordance with various embodiments, there is an exposure system for writing a pattern on a photosensitive material. The exposure system can include a waveguide array and a light modulator. The waveguide array can include a plurality of optical fibers that focuses light on the radiation sensitive material. The light modulator can modulate the light coupled into the plurality of optical fibers. Exemplary exposure systems can reduce aberrations due to coma and distortion, and provide improved alignment.

Method Of Making Hierarchical Articles

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US Patent:
20090041986, Feb 12, 2009
Filed:
Apr 15, 2008
Appl. No.:
12/103090
Inventors:
Jun-Ying Zhang - Woodbury MN, US
Jerome C. Porque - Austin TX, US
Jennifer J. Sahlin - Minneapolis MN, US
Terry L. Smith - Roseville MN, US
Ding Wang - Austin TX, US
International Classification:
B32B 3/02
C23F 1/02
B29C 41/42
US Classification:
428156, 216 41, 216 51, 264334, 264300
Abstract:
Provided is a method of fabricating hierarchical articles that contain nanofeatures and microstructures. The method includes providing a substrate that includes nanofeatures and then creating microstructures adding a layer, removing at least a portion of the layer to reveal at least a portion of the substrate.

Fabrication Of Conductive Nanostructures On A Flexible Substrate

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US Patent:
20110240476, Oct 6, 2011
Filed:
Dec 2, 2009
Appl. No.:
13/130064
Inventors:
Ding Wang - Austin TX, US
Jerome C. Porque - Bridgewater NJ, US
International Classification:
C25D 1/00
US Classification:
205 67
Abstract:
Provided is a method of fabricating a continuous nanostructured material having an electrodeposited surface layer. A conductive master drum having a relief pattern on its surface that exposes only a portion of the master drum surface is immersed into a plating bath. An electrodepositable material is coated onto the exposed surface of the drum. A support material is coated over the deposited layer and the relief structure. Removal from the drum yields the nanostructured material.
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Jerome C Porque from Lebanon, NJ, age ~55 Get Report