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Jeremiah R Lowney

from Leonardtown, MD
Age ~77

Jeremiah Lowney Phones & Addresses

  • 41550 Susie Ct, Leonardtown, MD 20650 (301) 475-1928
  • Silver Spring, MD
  • Gaithersburg, MD
  • Norristown, PA
  • Brookeville, MD
  • 41550 Susie Ct, Leonardtown, MD 20650 (301) 573-8118

Work

Position: Professional/Technical

Emails

Professional Records

Medicine Doctors

Jeremiah Lowney Photo 1

Jeremiah J. Lowney

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Specialties:
Internal Medicine
Work:
Lowney Medical Associates
1234 Hyde Park Ave STE 101, Hyde Park, MA 02136
(617) 364-2420 (phone), (617) 364-1845 (fax)
Education:
Medical School
University of New England College of Osteopathic Medicine
Graduated: 1994
Procedures:
Arthrocentesis
Continuous EKG
Destruction of Benign/Premalignant Skin Lesions
Electrocardiogram (EKG or ECG)
Osteopathic Manipulative Treatment
Pulmonary Function Tests
Skin Tags Removal
Vaccine Administration
Wound Care
Conditions:
Abnormal Vaginal Bleeding
Acne
Acute Bronchitis
Acute Conjunctivitis
Acute Sinusitis
Languages:
English
Spanish
Description:
Dr. Lowney graduated from the University of New England College of Osteopathic Medicine in 1994. He works in Hyde Park, MA and specializes in Internal Medicine. Dr. Lowney is affiliated with Beth Israel Deaconess Hospital-Milton and New England Baptist Hospital.
Jeremiah Lowney Photo 2

Jeremiah Joseph Lowney

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Specialties:
Internal Medicine
Education:
University of New England (1994)

Publications

Isbn (Books And Publications)

Deviant Reality: Alternative World Views

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Author

Jeremiah Lowney

ISBN #

0205072437

What Were Your Parents Doing Back Then?: Youth and Drugs in a Southern California Beach Community from 1970 into the 21st Century

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Author

Jeremiah Lowney

ISBN #

0761821236

Us Patents

Target Configuration And Method For Extraction Of Overlay Vectors From Targets Having Concealed Features

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US Patent:
61469106, Nov 14, 2000
Filed:
Feb 2, 1999
Appl. No.:
9/241436
Inventors:
Michael W. Cresswell - Frederick MD
Santos Mayo - Rockville MD
Jeremiah R. Lowney - Leonardtown MD
Assignee:
The United States of America, as represented by the Secretary of Commerce - Washington DC
International Classification:
G01R 3126
H01L 2166
US Classification:
438 14
Abstract:
A method is provided for extracting overlay information from a target of an integrated circuit wafer wherein the first-level target has features wh are optically concealed by an overlying opaque planarized film. The target employed has an architecture including a resist feature on the planarized film and an embedded electron backscattering target feature disposed beneath the planarized film. This target is scanned with an electron bean of an energy sufficiently high (e. g. , at least 11 keV) to penetrate the planarized film, be backscattered by the backscattered feature and return through the planarized film or through the planarized film and the resist feature. Electrons backscattered from the conductive first-level target feature through the resist feature are detected and a signal profile is generated based thereon. This signal profile is analyzed to extract overlay information.
Jeremiah R Lowney from Leonardtown, MD, age ~77 Get Report