Resumes
Resumes
James Migliaccio Phones & Addresses
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8308 Point Oak Dr, Colfax, NC 27235 (336) 782-6677
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Utica, NY
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421 Guilford College Rd, Greensboro, NC 27409
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384 Wilbur Rd, Thousand Oaks, CA 91360
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4603 Crowne Lake Cir, Jamestown, NC 27282
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Syracuse, NY
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8308 Point Oak Dr, Colfax, NC 27235
Publications
Us Patents
System For Removing Debris From A Test Socket
View pageUS Patent:
7005872, Feb 28, 2006
Filed:
Feb 8, 2005
Appl. No.:
11/053218
Inventors:
Mark Lanowitz - Kernersville NC, US
James Migliaccio - Colfax NC, US
Jerome Ferr - Greensboro NC, US
Jeffrey Read - High Point NC, US
James Migliaccio - Colfax NC, US
Jerome Ferr - Greensboro NC, US
Jeffrey Read - High Point NC, US
Assignee:
RF Micro Devices, Inc. - Greensboro NC
International Classification:
G01R 31/02
B08B 9/00
B08B 7/04
B08B 3/00
A47L 15/00
B08B 9/00
B08B 7/04
B08B 3/00
A47L 15/00
US Classification:
324763, 134 30, 134 37, 134 34, 134 2218, 134 2212, 15303, 153161
Abstract:
A test fixture for an electronic device is provided that removes debris from a socket of the test fixture using back side air blow off. In general, the test fixture includes a circuit board, a socket on a front side of the circuit board, and an air manifold on a back side of the circuit board. Pressurized air is provided to the air manifold through an air supply inlet coupling the air manifold to an external pressurized air supply. At least one via formed through the circuit board fluidly couples the air manifold on the back side of the circuit board to the socket on the front side of the circuit board. Accordingly, the pressurized air from the air manifold flows through the vias and up through the socket such that debris is removed from the socket.
Systems For Testing Integrated Circuits
View pageUS Patent:
6541990, Apr 1, 2003
Filed:
Mar 30, 2001
Appl. No.:
09/822920
Inventors:
James A. Migliaccio - Newbury Park CA
Assignee:
Skyworks Solutions, Inc. - Newport Beach CA
International Classification:
G01R 3102
US Classification:
324755, 324754, 324761
Abstract:
Testing systems are provided for testing a device under test (DUT), such as an integrated circuit. A preferred testing system includes a test array that incorporates a frame. The frame defines an aperture that is appropriately sized and shaped for receiving a DUT and mounts a testing probe that is adapted to extend into the aperture. The probe preferably is received within a recess formed along a bottom surface of the frame, thereby tending to enable the bottom surface of the frame to properly engage a surface to which it is to be mounted. Additionally, the probe may incorporate a configuration that tends to maintain the position of the probe relative to the frame and, thus, relative to the aperture. For instance, a shaped portion may be intermediately disposed along the length of the probe. So configured, when the shaped portion of the probe is received within a corresponding complimentary-shaped portion of its recess, the probe is substantially prevented from being urged along its longitudinal axis.