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Jackson Fay Lui

from San Diego, CA
Age ~53
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Also known as:
Jackson Gong, Lui S Jackson
Phone and address:
10724 Passerine Way, San Diego, CA 92121
Related to:
Xian Cai LiuDonnie Lui, 49Shay GongDaniel J Gong, 46Sui W GongCindy Y Gong, 50Ming Chun Lui, 82Sau Kuen Lui, 76Jenny GongFay Y Gong, 52Gar G Gong, 83George T Gong, 55Suiwah Gong, 74Dick T Gong
Connected to:
Alice M Lui, 68Amelia L Lui, 48Angela Lui, 74Bonnie K Lui, 40Caleb Y Lui, 37Calvin W Lui, 88Chi S Lui, 52Choi Lui, 50Clare F Lui, 54Dawn H Lui, 58

Jackson Lui Phones & Addresses

  • 10724 Passerine Way, San Diego, CA 92121
  • 9216 Citrus View Ct, San Diego, CA 92126
  • 861 55Th St #A, Brooklyn, NY 11220
  • 2556 Harway Ave, Brooklyn, NY 11214
  • 2556 Harway Ave FL 2, Brooklyn, NY 11214
  • Ramona, CA
  • 1011 E Adams St #T E, Syracuse, NY 13210
  • 1101 E Adams St, Syracuse, NY 13210

Resumes

Resumes

Jackson Lui Photo 1

Principal Engineering Manager

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Location:
San Diego, CA
Industry:
Telecommunications
Work:
Comptek Federal Systems Jan 1994 - Sep 1996
Rf Engineer
Qualcomm Jan 1994 - Sep 1996
Principal Engineering Manager
Air Techniques Jan 1991 - Jan 1994
Junior Electrical Engineer
Education:
Brooklyn Technical High School
New York University - Polytechnic School of Engineering
Syracuse University
Skills:
Semiconductors
Testing
Pcb Design
Rf
Circuit Design
Analog
Ic
Debugging
Mixed Signal
Embedded Systems
Asic
Engineering Management
Simulations
Power Management
Systems Design
Engineering
System Design
Jackson Lui Photo 2

Jackson Lui

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Location:
United States

Publications

Us Patents

Apparatus And Methods Of Integrated-Circuit Device Testing

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US Patent:
20090079419, Mar 26, 2009
Filed:
Mar 21, 2008
Appl. No.:
12/053358
Inventors:
Jackson Lui - Ramona CA, US
Assignee:
QUALCOMM INCORPORATED - San Diego CA
International Classification:
G01R 31/26
US Classification:
3241581
Abstract:
A motherboard device (MB) interface board (DIB) configured as universal interface to a family of integrated circuit (IC) devices provides the electrical connectivity to automated test equipment (ATE) and physical mating commonality with an IC device handler for reduced time to market and enhanced economy for design validation and production verification testing. In particular, use of one or more daughter cards (DC) that mount to the MB DIB avoid redesign of the entire DIB assembly for a new IC design. Each DC can be more quickly designed at a lower cost than the entire DIB assembly, enabling replacement of any defective site. The DC increases the available surface area for mounting of support components for the device under test (DUT).
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Jackson Fay Lui from San Diego, CA, age ~53 Get Report