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Ivor G Barber

from Los Gatos, CA
Age ~65

Ivor Barber Phones & Addresses

  • 126 Cleland Ave, Los Gatos, CA 95030 (408) 354-0652 (408) 354-4562 (408) 356-6260
  • 126A Cleland Ave, Los Gatos, CA 95030
  • 2403 Appley Way, San Jose, CA 95124 (408) 356-6260
  • 410 Sheridan Ave #224, Palo Alto, CA 94306 (408) 356-6260
  • 446 Forest Ave #6, Palo Alto, CA 94301 (408) 356-6260
  • Santa Clara, CA
  • 126 Cleland Ave, Los Gatos, CA 95030

Education

Degree: Associate degree or higher

Publications

Us Patents

Thermal And Mechanical Attachment Of A Heatspreader To A Flip-Chip Integrated Circuit Structure Using Underfill

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US Patent:
6590292, Jul 8, 2003
Filed:
Jun 1, 2001
Appl. No.:
09/872327
Inventors:
Ivor G. Barber - Los Gatos CA
Zafer S. Kutlu - Menlo Park CA
Assignee:
LSI Logic Corporation - Milpitas CA
International Classification:
H01L 2348
US Classification:
257778, 257704, 257783
Abstract:
An integrated circuit structure and a method for packaging an integrated circuit are described. The integrated structure includes an integrated circuit that is inverted and solder bump mounted to a substrate. An underfill is used to encapsulate the solder bumps and form a rigid support layer between the integrated circuit and the substrate. A heatspreader, which has larger planar dimensions than the integrated circuit, is centrally attached to an upper surface of the integrated circuit with a thermally conductive material. Lateral portions of the heatspreader extending beyond the edges of the integrated circuit are attached to the substrate and sides of the integrated circuit by a thermally conductive underfill material. The thermally conductive underfill material thus employed, among other things, provides a robust mechanical support to the heatspreader and integrated circuit structure and eliminates the need for additional support structures such as conventional stiffener rings.

Thermal And Mechanical Attachment Of A Heatspreader To A Flip-Chip Integrated Circuit Structure Using Underfill

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US Patent:
6673708, Jan 6, 2004
Filed:
Mar 25, 2003
Appl. No.:
10/397065
Inventors:
Ivor G. Barber - Los Gatos CA
Zafer S. Kutlu - Menlo Park CA
Assignee:
LSI Logic Corporation - Milpitas CA
International Classification:
H01L 2144
US Classification:
438608, 438122
Abstract:
An integrated circuit structure and a method for packaging an integrated circuit are described. The integrated structure includes an integrated circuit that is inverted and solder bump mounted to a substrate. An underfill is used to encapsulate the solder bumps and form a rigid support layer between the integrated circuit and the substrate. A heatspreader, which has larger planar dimensions than the integrated circuit, is centrally attached to an upper surface of the integrated circuit with a thermally conductive material. Lateral portions of the heatspreader extending beyond the edges of the integrated circuit are attached to the substrate and sides of the integrated circuit by a thermally conductive underfill material. The thermally conductive underfill material thus employed, among other things, provides a robust mechanical support to the heatspreader and integrated circuit structure and eliminates the need for additional support structures such as conventional stiffener rings.

Via Construction For Structural Support

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US Patent:
6943446, Sep 13, 2005
Filed:
Nov 8, 2002
Appl. No.:
10/290953
Inventors:
John P. McCormick - Palo Alto CA, US
Ivor G. Barber - Los Gatos CA, US
Kumar Nagarajan - San Jose CA, US
Assignee:
LSI Logic Corporation - Milpitas CA
International Classification:
H01L023/34
H01L023/48
H01L023/52
US Classification:
257728, 257774, 257773, 257737, 257738, 257734, 257778, 257724, 257725, 257691, 257698, 257207, 257208, 257211
Abstract:
An integrated circuit having electrically conductive vias with a diameter of between about one micron and about fifty microns. Prior art vias have a diameter of between no less than 0. 3 microns to no more than 0. 8 microns. In this manner, stresses such as those that press down upon the top surface of the integrated circuit can be absorbed by the large vias and transferred past fragile layers, such as low k layers, so that the fragile layers are not damaged by the stresses.

Integrated Circuit Package And Method Having Wire-Bonded Intra-Die Electrical Connections

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US Patent:
7173328, Feb 6, 2007
Filed:
Apr 6, 2004
Appl. No.:
10/819684
Inventors:
Ivor Barber - Los Gatos CA, US
Assignee:
LSI Logic Corporation - Milpitas CA
International Classification:
H01L 23/48
US Classification:
257694, 257723, 257688, 438107, 438117
Abstract:
A semiconductor package having a substrate mounted die. The die configured having active circuit components and a top surface having bond pads electrically connected with circuitry of the die. The bond pads commonly being formed above active circuit components. The bond pads being electrically interconnected with wire bonds to establish intra-chip electrical connection between circuitry of the die. Methods of forming such packages are also disclosed.

Package Configuration And Manufacturing Method Enabling The Addition Of Decoupling Capacitors To Standard Package Designs

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US Patent:
7508062, Mar 24, 2009
Filed:
Mar 11, 2005
Appl. No.:
11/078052
Inventors:
Leah Miller - Fremont CA, US
Ivor Barber - Los Gatos CA, US
Aritharan Thurairajaratnam - San Jose CA, US
Assignee:
LSI Corporation - Milpitas CA
International Classification:
H01L 23/053
H01L 23/12
US Classification:
257700, 257E23175, 257532, 257698, 174260, 174262, 333 22 R
Abstract:
The present invention is directed to a method of fabricating an integrated circuit package having decoupling capacitors using a package design conceived for use without decoupling capacitors. The package is implemented with a minimal redesign of the original design and not requiring any redesign of the signal trace pattern. The invention involves replacing top and bottom bond pads with via straps and then covering the top and bottom reference planes with a dielectric layer having conductive vias that electrically connect with the underlying via straps. Planes having the opposite polarity of the underlying reference plane are then formed on the dielectric layer. These planes include an array of bonding pads in registry with the vias. Decoupling capacitors are mounted to the top of the package and electrically connected with the plane on top of the package and the immediately underlying reference plane without the electrical connections to the capacitors passing through the signal planes of the package.

Package Configuration And Manufacturing Method Enabling The Addition Of Decoupling Capacitors To Standard Package Designs

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US Patent:
7829424, Nov 9, 2010
Filed:
Jul 16, 2008
Appl. No.:
12/174479
Inventors:
Leah Miller - Fremont CA, US
Ivor Barber - Los Gatos CA, US
Aritharan Thurairajaratnam - San Jose CA, US
Assignee:
LSI Corporation - Milpitas CA
International Classification:
H01L 21/20
US Classification:
438379, 361780, 257700
Abstract:
The present invention is directed to a method of fabricating an integrated circuit package having decoupling capacitors using a package design conceived for use without decoupling capacitors. The package is implemented with a minimal redesign of the original design and not requiring any redesign of the signal trace pattern. The invention involves replacing top and bottom bond pads with via straps and then covering the top and bottom reference planes with a dielectric layer having conductive vias that electrically connect with the underlying via straps. Planes having the opposite polarity of the underlying reference plane are then formed on the dielectric layer. These planes include an array of bonding pads in registry with the vias. Decoupling capacitors are mounted to the top of the package and electrically connected with the plane on top of the package and the immediately underlying reference plane without the electrical connections to the capacitors passing through the signal planes of the package.

Integrated Circuit System Monitor

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US Patent:
20090285261, Nov 19, 2009
Filed:
May 17, 2008
Appl. No.:
12/122682
Inventors:
Michael J. Casey - East Twickenham, GB
Ivor G. Barber - Los Gatos CA, US
Gregory S. Winn - Ft. Collins CO, US
Julie L. Beatty - Campbell CA, US
Daniel G. Deisz - McLean VA, US
Assignee:
LSI CORPORATION - Milpitas CA
International Classification:
G01K 7/16
G01K 1/00
G01K 7/00
US Classification:
374178, 374100, 374163, 374E07001, 374E07018
Abstract:
A temperature monitoring circuit for an integrated circuit on a monolithic chip, the temperature monitoring circuit comprising a temperature sensor disposed on the monolithic chip, a system monitor disposed on the monolithic chip, and electrically conductive traces for electrically connecting the temperature sensor to the system monitor. In this manner, the temperature on the monolithic chip can be monitored by the integrated circuit itself, and appropriate action can be programmed to occur upon attaining various set points or conditions.

Semiconductor Device Assembly With Minimized Bond Finger Connections

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US Patent:
58959688, Apr 20, 1999
Filed:
Oct 24, 1997
Appl. No.:
8/957519
Inventors:
Ivor Barber - San Jose CA
International Classification:
H01L 2348
US Classification:
257692
Abstract:
A semiconductor device assembly having external connections, including power supply connections such as to a power source or ground, is made without resort to bond fingers. Rather, external connections are directly made from a semiconductor die to a conductive layer. The conductive layer is disposed on one surface of a printed wring board and is divided into electrically insulated conductive segments. Each of the conductive segments is connected to an external connection, and includes one or more interconnects that can be directly connected to a semiconductor die. The conductive segments are surrounded by an array of bond fingers which serve to connect the semiconductor die to further external connections, such as signal connections. The present invention is especially advantageous in the fabrication of pin grid array (PGA) and ball grid array (BGA) type integrated circuit packages.
Ivor G Barber from Los Gatos, CA, age ~65 Get Report