US Patent:
20100131522, May 27, 2010
Inventors:
Hien Duy Dam - Manhattan Beach CA, US
International Classification:
G06F 17/30
G06F 7/00
US Classification:
707756, 707E17001, 707E17044
Abstract:
A method for automated data mapping and analysis is described. The method includes receiving test data from a plurality of test objects at a data storage facility, selecting a test environment and analysis parameters from a user interface, retrieving a portion of the test data from the data storage facility based on the selected test environment and analysis parameters, ensuring the retrieved test data is in a common format, and analyzing the retrieved test data to generate at least one of a trending profile, an overlay profile, and a maintenance profile for the test objects for the selected analysis parameter.
