Resumes
Resumes
George Niu Phones & Addresses
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Irvine, CA
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Phoenix, AZ
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1354 Flicker Way, Sunnyvale, CA 94087 (408) 736-2082 (408) 242-7845
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1616 Mariani Dr, Sunnyvale, CA 94087 (408) 736-0082
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1616 Bernardo Ave, Sunnyvale, CA 94087 (408) 736-2082
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Lake Elsinore, CA
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Alamo, CA
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San Jose, CA
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Santa Clara, CA
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Auburndale, MA
Publications
Us Patents
Computer Controlled High-Speed Circuit For Testing Electronic Devices
View pageUS Patent:
RE310565, Oct 12, 1982
Filed:
May 28, 1980
Appl. No.:
6/154151
Inventors:
Yuk B. Chau - Torrance CA
George Niu - Sunnyvale CA
Rudolph Staffelbach - Santa Clara CA
George Niu - Sunnyvale CA
Rudolph Staffelbach - Santa Clara CA
Assignee:
Fairchild Camera & Instrument Corp. - Mountain View CA
International Classification:
G01R 1512
G01R 3102
G01R 3102
US Classification:
324 73R
Abstract:
High-speed testing circuitry which, when coupled to one terminal of a multi-terminal electronic device, such as an integrated circuit, can either supply test stimuli signals up to a frequency of 30 MHz, receive output signals produced by the device under test in response to test stimuli signals applied by associated test circuits and compare these signals against computer predicted signals, or provide for parametric testing of the device. . Iadd.
High-Speed Testing Circuit
View pageUS Patent:
40925897, May 30, 1978
Filed:
Mar 23, 1977
Appl. No.:
5/780382
Inventors:
Yuk Bun Chau - Fremont CA
George Niu - Santa Clara CA
Rudolph Staffelbach - Mountain View CA
George Niu - Santa Clara CA
Rudolph Staffelbach - Mountain View CA
Assignee:
Fairchild Camera and Instrument Corp. - Mountain View CA
International Classification:
G01R 1512
US Classification:
324 73R
Abstract:
High-speed testing circuitry which, when coupled to one terminal of a multi-terminal electronic device, such as an integrated circuit, can either supply test stimuli signals up to a frequency of 30 MHz, receive output signals produced by the device under test in response to test stimuli signals applied by associated test circuits and compare these signals against computer predicted signals, or provide for parametric testing of the device.