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Geert J Wijntjes

from Davidsonville, MD
Age ~89

Geert Wijntjes Phones & Addresses

  • Davidsonville, MD
  • 27 Beverly Rd, Pocasset, MA 02559
  • Chelsea, MA
  • Belmont, MA
  • Londonderry, NH

Publications

Us Patents

Hyper-Dense Wavelength Multiplexing System

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US Patent:
6718143, Apr 6, 2004
Filed:
May 13, 2002
Appl. No.:
10/144585
Inventors:
Geert Johannes Wijntjes - Chelsea MA
Assignee:
Visidyne, Inc. - Burlington MA
International Classification:
H04B 1006
US Classification:
398202, 398188, 398212
Abstract:
An improved system and method of decoding a phase modulated encoding of a pair of optical beams is preferably achieved by generating a plurality of optical fringes from the pair of optical beams, sampling each optical fringe and generating a set of at least three phase offset signals from each sampled optical fringe, each generated signal having a unique and known phase difference relative to each sampled optical fringe, and by deriving a quantitative representation of the phase encoding of the pair optical beams from information provided from each set of generated signals. Optionally, the quantitative representation is converted into an electric signal.

Non-Contact Optical Polarization Angle Encoder

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US Patent:
20030095257, May 22, 2003
Filed:
Nov 6, 2002
Appl. No.:
10/288875
Inventors:
Geert Wijntjes - Chelsea MA, US
Constantine Markos - Lynn MA, US
International Classification:
G01J004/00
US Classification:
356/364000
Abstract:
An optically coupled rotary encoder that is capable of measuring and encoding the angle of rotation of a rotating or stationary object. A polarizer rotates synchronously with the rotatable object and inputs broadband or single frequency unpolarized light. The polarizer outputs and directs polarized light towards a plurality of fixed analyzers and light detectors. Each fixed analyzer outputs and directs further polarized light towards one of the light detectors. Each light detector outputs an electrical signal to a phase processor based upon one attribute of the further polarized light. The phase processor outputs a phase angle with high resolution ( 10 bit) with high accuracy and frequency (5 Mhz). The system and method can operate in harsh environments having high temperatures, dirt and debris and is not susceptible to EMI/RFI.

Non-Contact Optical Polarization Angle Encoder

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US Patent:
20050002032, Jan 6, 2005
Filed:
May 5, 2004
Appl. No.:
10/839073
Inventors:
Geert Wijntjes - Chelsea MA, US
Constantine Markos - Lynn MA, US
International Classification:
G01D005/34
G01J004/00
US Classification:
356364000, 250231160, 250225000
Abstract:
An optically coupled rotary encoder that is capable of measuring and encoding the angle of rotation of a rotating or stationary object. A polarizer rotates synchronously with the rotatable object and inputs broadband or single frequency unpolarized light. The polarizer outputs and directs polarized light towards a plurality of fixed analyzers and light detectors. Each fixed analyzer outputs and directs further polarized light towards one of the light detectors. Each light detector outputs an electrical signal to a phase processor based upon one attribute of the further polarized light. The phase processor outputs a phase angle with high resolution (>12 bit) with high accuracy and frequency (5 MHz). The system and method can operate in harsh environments having high temperatures, dirt and debris and is not susceptible to EMI/RFI.

Laser Stabilization Servo System

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US Patent:
46726187, Jun 9, 1987
Filed:
Jul 9, 1986
Appl. No.:
6/884872
Inventors:
Geert Wijntjes - Belmont MA
Michael Hercher - Marblehead MA
Assignee:
Beckman Instruments, Inc. - Fullerton CA
International Classification:
H01S 313
US Classification:
372 32
Abstract:
A method and means for stabilizing the difference in frequencies between the frequency components of a two frequency laser beam influenced by Zeeman effect frequency splitting, accurately determines the frequency separation independently of the individual frequencies or intensities of either of the frequency components. Frequency stabilization is accomplished by mechanical and thermal adjustments to the lasing chamber length of the laser by a closed loop servo control referencing the frequency difference between laser beam components and a reference signal having a frequency equal to the desired frequency difference.

Mirror Scan Velocity Control

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US Patent:
46555870, Apr 7, 1987
Filed:
Sep 25, 1985
Appl. No.:
6/781185
Inventors:
Geert Wijntjes - Belmont MA
Michael Hercher - Marblehead MA
Assignee:
Beckman Instruments, Inc. - Fullerton CA
International Classification:
G01J 345
G01B 902
US Classification:
356346
Abstract:
An improved mirror scan control for driving a movable mirror in an interferometer with a constant scan velocity comprises a closed loop servo control which provides constant velocity mirror scan in response to a phase comparison of a signal derived from the beat frequency of a two frequency laser beam passing through the interferometer and a selected frequency reference signal, wherein the difference in frequencies or beat frequency of the two frequency laser beam is stabilized at a specified difference in frequencies. The mirror scan control employs a phase lock control loop which locks the frequency of the referenced signal with the frequency of the signal derived from the laser beam to provide precise mirror velocity control.

Dynamic Mirror Alignment Control

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US Patent:
47115734, Dec 8, 1987
Filed:
Dec 12, 1986
Appl. No.:
6/940196
Inventors:
Geert Wijntjes - Belmont MA
Michael Hercher - Marblehead MA
Assignee:
Beckman Instruments, Inc. - Fullerton CA
International Classification:
G01J 345
US Classification:
356346
Abstract:
An improved mirror alignment control for dynamically aligning the reflecting mirrors bounding the optical path in an interferometer comprises a closed loop servo control which utilizes a two frequency laser beam to provide phase comparison between beams traversing differing portions of the optical paths in the interferometer to determine alignment of the mirrors, said phase comparison providing a correction signal to direct multi-axial alignment of at least one of the mirrors.

Meterology Using Interferometric Measurement Technology For Measuring Scale Displacement With Three Output Signals

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US Patent:
50981900, Mar 24, 1992
Filed:
Aug 7, 1989
Appl. No.:
7/390192
Inventors:
Geert J. Wijntjes - Chelsea MA
Michael Hercher - Marblehead MA
Assignee:
Optra, Inc. - Beverly MA
International Classification:
G01B 902
US Classification:
356356
Abstract:
A metrology system includes means for generating an interference fringe pattern as a function of a parameter to be measured, transducer apparatus for simultaneously generating three intensity-modulated optical signals, I. sub. R, I. sub. S and I. sub. T, that are related to the interference fringe pattern; signal processing apparatus for accurately determining an aspect of the interference fringe pattern from the three signals; means for accumulating phase information proportional to the aspect of the interference fringe pattern; and means for converting the accumulated phase and aspect information to desired outputs indicative of the parameter to be measured.
Geert J Wijntjes from Davidsonville, MD, age ~89 Get Report