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Gary Pedeville Phones & Addresses

  • 16819 319Th Ct NE, Duvall, WA 98019
  • Kapolei, HI
  • s
  • 37 Foxtail Ln, North Chili, NY 14514
  • Rochester, NY
  • Redmond, WA
  • Columbus, IN
  • Honolulu, HI

Work

Company: Radiant imaging, inc. Position: Engineer

Industries

Electrical/Electronic Manufacturing

Resumes

Resumes

Gary Pedeville Photo 1

Engineer At Radiant Imaging, Inc.

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Position:
Engineer at Radiant Imaging, inc.
Location:
Greater Seattle Area
Industry:
Electrical/Electronic Manufacturing
Work:
Radiant Imaging, inc.
Engineer

Valeo Sylvania 1993 - 2001
Optical Engineer

Publications

Us Patents

Systems And Methods For Measuring Spatial And Angular Performance Of A Visual Display

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US Patent:
7995098, Aug 9, 2011
Filed:
Sep 11, 2006
Appl. No.:
11/519546
Inventors:
Gary Robert Pedeville - Duvall WA, US
Ronald F. Rykowski - Woodinville WA, US
Assignee:
Radiant Imaging, Inc. - Duvall WA
International Classification:
H04N 17/00
H04N 17/02
H04N 3/14
H04N 3/12
H04N 5/66
H04N 9/12
US Classification:
348190, 348177, 348180, 348184, 348790, 348795, 348797
Abstract:
Systems and methods for measuring spatial and angular performance of a visual display are disclosed herein. In one particular embodiment, for example, a method for measuring spatial and angular performance of a flat panel visual display includes capturing a plurality of image measurements from a visual display at a plurality of different view angles. The method also includes selecting one or more points of interest on the visual display, and calculating tristimulus values (X, Y, Z) for each point of interest at each of the plurality of view angles. The method further includes generating a view angle performance plot for the one or more selected points of interest.

Method Of Correcting Image Shift

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US Patent:
20030223648, Dec 4, 2003
Filed:
May 29, 2002
Appl. No.:
10/157176
Inventors:
Richard Albrecht - Chapel Hill NC, US
Gary Pedeville - Duvall WA, US
Ronald Rykowski - Woodinville WA, US
C. Wooley - Chapel Hill NC, US
International Classification:
G06K009/32
US Classification:
382/294000
Abstract:
A method of correcting image shift and magnification differences of multiple images which are used to create a single measurement of an imaging light and color measurement device. The multiple images are taken from a test object utilizing the imaging light and color measurement device through different optical paths. Software is utilized to shift the pixels vertically and/or horizontally with a shift fraction determined based on the magnitude of the image shift in a direction opposing to the shift. Software is uses to further move the pixels inwardly or outwardly with a pixel value determined on the magnification differential of images.

Methods And Apparatuses For Determining A Color Calibration For Different Spectral Light Inputs In An Imaging Apparatus Measurement

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US Patent:
20070177230, Aug 2, 2007
Filed:
Jan 30, 2006
Appl. No.:
11/343501
Inventors:
Douglas Kreysar - Duvall WA, US
Matthew Lekson - Woodinville WA, US
Gary Pedeville - Duvall WA, US
International Classification:
H04N 1/46
US Classification:
358504000, 358001900
Abstract:
Methods and apparatuses for determining a color calibration for different spectral light inputs in an imaging apparatus measurement are disclosed herein. In one embodiment, for example, a method for determining a color calibration for different spectral light inputs in an imaging apparatus measurement can include creating a reference color calibration and a reference luminance scaling calibration for each of a plurality of colors. The method can also include measuring a reference gray value R, G, B for each color in an image measurement of the light source. The method can further include calculating an R, G, B gray value for a first pixel in each of three filtered image measurements. The method can then include calculating pixel ratio values from each of the three first pixel gray values and comparing the reference gray values to the pixel ratio values to determine which one or more reference gray values are closest to the pixel ratio values. The method further includes calculating X, Y, Z values for the first pixel in the image measurement, and then repeating the steps of the method beginning with calculating an R, G, B gray value for each subsequent pixel in the image measurement.
Gary R Pedeville from Duvall, WA, age ~60 Get Report