US Patent:
20030150909, Aug 14, 2003
Inventors:
Charles Markham - Appleton WI, US
Douglas Barber - Appleton WI, US
Amy Boyd - Neenah WI, US
Gary Goggans - Appleton WI, US
John Hise - Neenah WI, US
Sheryl Ihde - Greenville WI, US
Jeffrey Lindsay - Appleton WI, US
Jolene Meissner - DePere WI, US
Jamie Mork - Greenville WI, US
Kurt Nygaard - Appleton WI, US
Scott Park - Menasha WI, US
Michael Pokorny - Neenah WI, US
Walter Reade - Appleton WI, US
John Reynders - Appleton WI, US
Gregory Shaffer - Neenah WI, US
Roger Yosten - Sumner TX, US
Assignee:
Kimberly-Clark Worldwide, Inc.
International Classification:
G06F007/00
Abstract:
Providing quality management by validating a bill of materials in event-based product manufacturing. Some of the disclosed embodiments include a system and method for validating materials during manufacture of a product. Also disclosed are a method of validating that acceptable materials are being used on a machine during manufacture of a product, and one or more computer-readable media for storing a data structure representing a product specification in an event-based manufacturing system. The embodiments are operable in an intelligent manufacturing system including a process for converting raw materials to a product, a process control system including one or more sensors capable of generating an alarm in response to an event that results in one of waste, machine delay, or decrease product quality, a data logger associated with the process control system for obtaining event parameters associated with the event, a database on a server for recording event parameters obtained by the data logger, and a reporting system cooperatively associated with the database for reporting productivity parameters regarding the process derived at least in part from the event parameters.