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Francis Karwowski Phones & Addresses

  • 709 Bedford Rd, Schenectady, NY 12308 (518) 346-0247 (518) 377-6004
  • Tamarac, FL
  • 709 Bedford Rd, Schenectady, NY 12308

Work

Position: Sales Occupations

Publications

Us Patents

Micrometer Support Apparatus And Measurement Method Using Same

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US Patent:
7356941, Apr 15, 2008
Filed:
May 25, 2006
Appl. No.:
11/441285
Inventors:
Francis Ignatius Karwowski - Schenectady NY, US
Assignee:
General Electric Company - Schenectady NY
International Classification:
G01B 3/18
US Classification:
33828, 33832
Abstract:
A method for measuring a distance with a pin micrometer includes attaching a pin micrometer support to a flange at a predetermined location on the flange in a first channel, supporting a pin micrometer in a stationary position in a second channel, and extending a measurement rod of the pin micrometer to a location to which the distance is to be measured.

Rotor Clearance Measurement Gage

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US Patent:
6886267, May 3, 2005
Filed:
Dec 16, 2003
Appl. No.:
10/707468
Inventors:
Francis Ignatius Karwowski - Schenectady NY, US
Peter R. Corey - Amsterdam NY, US
Assignee:
General Electric Company - Schenectady NY
International Classification:
G01D021/00
US Classification:
33613, 33531, 3350145, 335444
Abstract:
A measurement gage includes a base having two scales at opposite site ends of the base for different ranges of measurement. A tapered feeler gage elements projects axially from each of the opposite ends, and a slide bar is movable along the base, with an indicator fixed thereto for each of the two different scales. Movement of the slide bar in each of two opposite axial directions is calibrated to respective thicknesses of the tapered feeler gage elements.
Francis I Karwowski from Schenectady, NY, age ~75 Get Report