US Patent:
20080254544, Oct 16, 2008
Inventors:
Brent E. Modzelewski - Boca Raton FL, US
Ferhan Kayihan - Tacoma WA, US
Edward Cardello - Wellington FL, US
International Classification:
G01N 33/48
G06F 15/18
H03M 13/47
US Classification:
436 43, 422 681, 706 14, 714777, 714799, 714819
Abstract:
A system for measuring a property of a sample is provided. The system comprises a diagnostic measuring device having a memory and a diagnostic test strip for collecting the sample. The strip has embedded thereon a pattern representative of at least first data and second data, the first data being data representing at least one of parameters related to measuring the property, codes usable for calibration of the diagnostic measuring device, or parameters indicating proper connection between the measuring device and the test strip and the second data usable for detecting and rejecting potential errors affecting the proper measurement of the property.