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Eric L Lifshin

from East Sandwich, MA
Age ~85
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Also known as:
Eric A Lifshin, Eric M Lifshin
Related to:
Grace H ChengEric S ChengShane Rogers, 48Rachel RogersSarah S Lifshin, 39Zeph P Jackson, 30Rachael A Lifshin, 49Mary D Lifshin, 62David Lifshin, 46
Connected to:
Alexander Lifshits, 88Benjamin C Lifshitz, 64Brandon M Lifshitz, 54Eyal Lifshitz, 47Ilya Lifshits, 38Julia Lifshitz, 93Leonid Lifshits, 64Miriam Lifshitz, 51Brian J Lifsted, 61Alan J Liftin, 65

Eric Lifshin Phones & Addresses

  • East Sandwich, MA
  • Albany, NY
  • West Hollywood, CA
  • 40 Springfield Dr, Voorheesville, NY 12186 (518) 765-5709
  • Sherman Oaks, CA

Resumes

Resumes

Eric Lifshin Photo 1

Professor

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Location:
6 Arrowhead Cir, East Sandwich, MA 02537
Industry:
Higher Education
Work:
University at Albany
Professor
Education:
Rensselaer Polytechnic Institute 1969
Doctorates, Doctor of Philosophy, Materials Science, Philosophy
Skills:
Spectroscopy
Thin Films
Student Affairs
Science
Higher Education
Materials Science
Scanning Electron Microscopy
Characterization
University Teaching
Teaching
Nanotechnology
Optics
Student Development
Curriculum Development
Courses
R&D
Microscopy
Research
Statistics
Physics
College Teaching
Distance Learning
Eric Lifshin Photo 2

Eric Lifshin

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Business Records

Name / Title
Company / Classification
Phones & Addresses
Eric Lifshin
Director
Eyp, Inc
Architectural Services · Architectural Services Engineering Services
257 E Fuller Rd S, Albany, NY 12203
Eric Lifshin
Director
Albany Nanotech
University-Based Global Research Development Technology Deployment and Education Resource Center
251 Fuller Rd, Albany, NY 12203
(518) 437-8686

Publications

Us Patents

Apparatus And Method For Increasing X-Ray Tube Power Per Target Thermal Load

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US Patent:
6421422, Jul 16, 2002
Filed:
Apr 11, 2000
Appl. No.:
09/547242
Inventors:
Eric Lifshin - Voorheesville NY
Amy Linsebigler Smentkowski - Clifton Park NY
William Guy Morris - Rexford NY
Lembit Salasoo - Niskayuna NY
Subhasish Roychoudhury - Albany NY
Assignee:
General Electric Company - Niskayuna NY
International Classification:
H01J 3502
US Classification:
378121, 378125, 378143
Abstract:
An X-ray tube assembly includes an anode, a cathode, and an X-ray transparent window. The anode includes an X-ray-producing target having a surface. The cathode has an electron-beam axis which intersects the target surface at a focal point and which is oriented at a first angle, with respect to the target surface, wherein the first angle is generally twenty degrees. The window includes a surface having a center point. A line between the focal and center points makes a second angle, with respect to the target surface, wherein the second angle is generally seven degrees. A method for producing X-rays employs these angles.

Scanning Incremental Focus Microscopy

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US Patent:
20120097848, Apr 26, 2012
Filed:
Oct 25, 2010
Appl. No.:
12/911334
Inventors:
Eric LIFSHIN - Voorheesville NY, US
Michael STESSIN - Niskayuna NY, US
Assignee:
The Research Foundation of State University of New York - Albany NY
International Classification:
G01N 23/04
US Classification:
250307, 250310
Abstract:
Method and apparatus are provided for generating an enhanced image of an object. The method includes obtaining images of an area of an object generated using a probe of having a probe size greater than or equal to a minimum probe area size. An enhanced image of the area of the object is generated by accurately computing the emission intensities emitted from pixel areas smaller than the minimum probe size and within the area of the object. This is repeated for other areas of the object to form other enhanced images. The enhanced images are combined to form an accurate enhanced image of the object.

Transfer Lamination Of Copper Thin Sheets And Films, Method And Product

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US Patent:
43830030, May 10, 1983
Filed:
Sep 22, 1980
Appl. No.:
6/189003
Inventors:
Eric Lifshin - Loudonville NY
Joseph D. Cargioli - Schenectady NY
Stephen J. Schroder - Schenectady NY
Joe Wong - Schenectady NY
Assignee:
General Electric Company - Schenectady NY
International Classification:
B32B 1520
US Classification:
428611
Abstract:
A copper-clad laminate having special utility in the production of high resolution printed circuit patterns by either subtractive or semi-additive processing is made by vapor depositing a film of zinc on a copper film on a silica-coated aluminum carrier sheet, vapor depositing a silica film on the resulting zinc-copper foil, bonding the resulting body to a substrate and then stripping the silica-coated aluminum carrier sheet from the copper-clad laminate.

Method Of Transfer Lamination Of Copper Thin Sheets And Films

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US Patent:
44551819, Jun 19, 1984
Filed:
Feb 22, 1983
Appl. No.:
6/468097
Inventors:
Eric Lifshin - Loudonville NY
Joseph D. Cargioli - Schenectady NY
Stephen J. Schroder - Schenectady NY
Joe Wong - Schenectady NY
Assignee:
General Electric Company - Schenectady NY
International Classification:
B32B 1520
B44C 114
B05C 136
B21D 3900
US Classification:
156150
Abstract:
A copper-clad laminate having special utility in the production of high resolution printed circuit patterns by either subtractive or semi-additive processing is made by vapor depositing a film of zinc on a copper film on a silica-coated aluminum carrier sheet, vapor depositing a silica film on the resulting zinc-copper foil, bonding the resulting body to a substrate and then stripping the silica-coated aluminum carrier sheet from the copper-clad laminate.

Transfer Lamination Of Vapor Deposited Foils, Method And Product

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US Patent:
43573959, Nov 2, 1982
Filed:
Aug 22, 1980
Appl. No.:
6/180341
Inventors:
Eric Lifshin - Loudonville NY
Joseph D. Cargioli - Schenectady NY
Stephen J. Schroder - Schenectady NY
Joe Wong - Schenectady NY
Assignee:
General Electric Company - Schenectady NY
International Classification:
B21C 3700
C25D 704
B21D 3900
B32B 324
US Classification:
428607
Abstract:
A copper-clad laminate having special utility in printed circuit board production because of its extremely smooth and virtually pinhole-free surface is made by vapor depositing a copper film on a layer of silica on an aluminum carrier sheet, electrodepositing a layer of copper on the film to form a foil, bonding the foil to a substrate and finally stripping the foil and substrate laminate from the silica-coated carrier sheet.

Mass Spectrometer Desorption Device Including Field Anode Eutectic Alloy Wire And Auxiliary Electrical Resistance Heating Means

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US Patent:
41106121, Aug 29, 1978
Filed:
Apr 27, 1977
Appl. No.:
5/791569
Inventors:
Woodfin V. Ligon - Schenectady NY
Eric Lifshin - Loudonville NY
Assignee:
General Electric Company - Schenectady NY
International Classification:
B01D 5944
US Classification:
250281
Abstract:
This mass spectrometer field desorption device has a field anode in the form of a directionally solidified alloy eutectic wire of relatively large active surface and includes electrical resistance heating element to heat the field anode and thereby improve field desorption performance.

Laminate Product Of Ultra Thin Copper Film On A Flexible Aluminum Carrier

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US Patent:
44317107, Feb 14, 1984
Filed:
May 27, 1983
Appl. No.:
6/499019
Inventors:
Eric Lifshin - Loudonville NY
Margo E. Gill - Mountain View CA
Assignee:
General Electric Company - Schenectady NY
International Classification:
B32B 1520
US Classification:
428650
Abstract:
A copper-clad laminate having special utility in the production of high resolution printed circuit patterns is made by a method which includes as the step of forming an initial copper film by vapor depositing copper directly in contact with an as-rolled aluminum carrier sheet at temperature between about 100. degree. C. and 250. degree. C. so that the carrier release peel strength has an average value between about 0. 5 and 2. 0 pounds per inch.

Image Processing System And Method Of Processing Images

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US Patent:
20170345615, Nov 30, 2017
Filed:
May 24, 2017
Appl. No.:
15/603998
Inventors:
- Albany NY, US
Eric Lifshin - Voorheesville NY, US
International Classification:
H01J 37/28
G06K 9/52
G06K 9/62
H01J 37/02
Abstract:
The disclosure relates to systems and method for processing images. The method includes selecting a predetermined reference structure, the predetermined reference structure having a known feature size/shape. The method also includes obtaining a reference image of the predetermined reference structure, and capturing a calibration image of the predetermined reference structure using an observation device. The calibration image includes a plurality of features. Additionally, the method includes identifying at least one portion of the plurality of features of the calibration image that include a feature size/shape substantially similar to the known feature size and shape of the predetermined reference structure. Finally, the method includes combining the identified portion of the plurality of features of the calibration image to form a stacked feature image, and determining a point spread function (PSF) of the observation device by comparing the obtained reference image with the stacked feature image.

Isbn (Books And Publications)

Concise Encyclopedia of Materials Characterization

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Author

Eric Lifshin

ISBN #

0080406033

Scanning Electron Microscopy and X-Ray Microanalysis

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Author

Eric Lifshin

ISBN #

0306472929

Materials Science and Technology, Characterization of Materials Part II

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Author

Eric Lifshin

ISBN #

3527282653

X-Ray Characterization of Materials

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Author

Eric Lifshin

ISBN #

3527296573

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Eric L Lifshin from East Sandwich, MA, age ~85 Get Report