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Duncan Kearsley Phones & Addresses

  • Stanwood, WA
  • Hawthorne, CA
  • Redondo Beach, CA
  • Fremont, CA
  • Snohomish, WA
  • 30215 41St Ave NW, Stanwood, WA 98292 (360) 629-2703

Work

Position: Professional/Technical

Education

Degree: Graduate or professional degree

Emails

Publications

Us Patents

Electrical Test Instrument

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US Patent:
D467190, Dec 17, 2002
Filed:
May 14, 2001
Appl. No.:
29/141875
Inventors:
John K. Ikeda - Seattle WA
Duncan N. Kearsley - Stanwood WA
Assignee:
Fluke Corporation - Everett WA
International Classification:
1004
US Classification:
D10 79

Electrical Test Instrument Body

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US Patent:
D474704, May 20, 2003
Filed:
Sep 27, 2002
Appl. No.:
29/168298
Inventors:
John K. Ikeda - Seattle WA
Duncan N. Kearsley - Stanwood WA
Assignee:
Fluke Corporation - Everett WA
International Classification:
1004
US Classification:
D10 79

Electrical Tester

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US Patent:
D580805, Nov 18, 2008
Filed:
Jan 30, 2008
Appl. No.:
29/303020
Inventors:
Chris Lagerberg - Seattle WA, US
Duncan Kearsley - Stanwood WA, US
Assignee:
Fluke Corporation - Everett WA
International Classification:
1004
US Classification:
D10 78

Instrument For Testing An Electrical Circuit

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US Patent:
20090189597, Jul 30, 2009
Filed:
Jan 30, 2008
Appl. No.:
12/022793
Inventors:
Chris Lagerberg - Seattle WA, US
Duncan Kearsley - Stanwood WA, US
Matthew Castle - Lynnwood WA, US
Charles Bowden - Seattle WA, US
Assignee:
FLUKE CORPORATION - Everett WA
International Classification:
G01R 19/155
US Classification:
324133
Abstract:
An instrument for testing an electrical circuit includes a housing, a printed circuit board disposed within the housing, and at least one probe in electrical communication with the printed circuit board. The instrument further includes a plurality of panels disposed within the housing, wherein each one of the plurality of panels has an indicator. Each of the plurality of panels is capable of being activated into an on state in response to an electrical measurement. When at least one of the plurality of panels is activated the indicator on that panel substantially corresponds to a magnitude of the electrical measurement.

Voltage Tester Having Alternatively Attachable Or Separable Probes

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US Patent:
20130093448, Apr 18, 2013
Filed:
Oct 12, 2011
Appl. No.:
13/271297
Inventors:
Ferdinand LAURINO - Seattle WA, US
Duncan Nigel KEARSLEY - Stanwood WA, US
Assignee:
FLUKE CORPORATION - Everett WA
International Classification:
G01R 31/20
US Classification:
32475411
Abstract:
A tester includes a main body and a removable probe. The main body includes a main body probe and a front panel including selectable options for selecting a tester function. The removable probe may be coupled to the main body via a cord. The removable probe is fixable to the main body via a latch assembly. The latch assembly including a socket disposed on one of the removable probe or the main body and a mating protrusion disposed at the other of the removable probe or the main body, the main body having a probe support ridge associated therewith and the removable probe having an alignment ridge associated therewith, the alignment ridge and the probe support ridge lying in a same plane when the mating protrusion is inserted into the socket.

Electronic Instrument

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US Patent:
D4357973, Jan 2, 2001
Filed:
Feb 29, 2000
Appl. No.:
D/119393
Inventors:
Wayne S. Hoofnagle - Redmond WA
Duncan N. Kearsley - Stanwood WA
Assignee:
Fluke Corporation - Everett WA
International Classification:
1004
US Classification:
D10 78
Duncan N Kearsley from Stanwood, WA, age ~58 Get Report