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Debasish Mishra

from Schenectady, NY
Age ~55
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Also known as:
Debasis Misara, A Misara
Connected to:
Achut R Mishra, 67Amitosh K Mishra, 44Amod K Mishra, 39Amy C Mishra, 50Anshul Mishra, 36Anuja Mishra, 43Aparna Mishra, 47Ashesh Mishra, 38Ashim K Mishra, 43Ashima Mishra, 50

Debasish Mishra Phones & Addresses

  • Schenectady, NY
  • 6 Hollandale Ln, Clifton Park, NY 12065 (518) 280-6685
  • 125 Terryville Rd, Port Jefferson Station, NY 11776 (631) 642-1910
  • Stony Brook, NY

Publications

Us Patents

Inspection Tool For Radiographic Systems

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US Patent:
20090086911, Apr 2, 2009
Filed:
Sep 27, 2007
Appl. No.:
11/862363
Inventors:
Manoharan Venugopal - Bangalore, IN
Nityanand Gopalika - Cincinnati OH, US
Manoj Kumar Meethal - Annur(PO), IN
Debasish Mishra - Clifton Park NY, US
Assignee:
GENERAL ELECTRIC COMPANY - SCHENECTADY NY
International Classification:
H05G 1/46
US Classification:
378 96
Abstract:
A system for radiographic inspection of an object is provided. The system comprises a radiation source configured to generate radiation, a display unit for generating a graphical user interface (GUI) including multiple fields. A user provides input data via the fields in the GUI. A processor configured to compute a plurality of exposure parameters based on the input data and a control system is configured to initialize the radiation source with the exposure parameters.

Radiographic Inspection System And Method

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US Patent:
20090086914, Apr 2, 2009
Filed:
Sep 28, 2007
Appl. No.:
11/864315
Inventors:
Manoharan Venugopal - Bangalore, IN
Debasish Mishra - Clifton Park NY, US
Raghu Chatanathodi - Calicut, IN
Richard Henry Bossi - Renton WA, US
Michael Craig Hutchinson - Kent WA, US
Assignee:
GENERAL ELECTRIC COMPANY - SCHENECTADY NY
International Classification:
H05G 1/08
H05G 1/46
US Classification:
378109, 378 91
Abstract:
A system is provided for radiographic inspection of an object comprising multiple having different material properties. The system comprises a radiation source configured to generate radiation, a display unit for generating a graphical user interface (GUI) including multiple fields. A user enters input data via the fields in the GUI. The input data relates to one or more material properties for each of the regions. A processor is configured to compute a plurality of exposure parameters based on the input data.
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Debasish Mishra from Schenectady, NY, age ~55 Get Report