Inventors:
Roy W. Green - Tabernacle NJ, US
Mark A. Bradford - Brentwood CA, US
Davis S. Dao - San Jose CA, US
Trung Van Nguyen - San Jose CA, US
James M. Ogg - Milpitas CA, US
Assignee:
inTEST Corporation - Cherry Hill NJ
International Classification:
G01R 31/02
G01R 1/073
Abstract:
An apparatus for interfacing a test head to a peripheral system is provided. The apparatus includes a first unit having a first connection member for providing electrical communication with the peripheral system, a second unit having a second connection member for providing electrical communication with the test system, and pivot members coupling the first unit and the second unit. The pivot members enable motion in the following sequence as one of the first and second unit moves towards the other: a) pivotal motion between the first connection member and the second connection member; and b) linear motion which decreases linear distance between the first connection member and the second connection member while maintaining respective contact surfaces of the first and second connection members in parallel.