Search

David Brien Noddin

from Earleville, MD
Age ~62

David Noddin Phones & Addresses

  • 4 Long Point Blvd, Earleville, MD 21919
  • 107 Bayview Rd, Chesapeake Cy, MD 21915 (410) 885-3721
  • Chesapeake City, MD
  • Chippewa Falls, WI
  • Georgetown, ME
  • Chippewa Falls, WI
  • Ledyard, CT

Work

Position: Professional/Technical

Emails

Business Records

Name / Title
Company / Classification
Phones & Addresses
David Noddin
Mbr
ADEPT ENGRAVING LLC
Business Services · Ret Misc Merchandise · Trophy Shops · Store Retailers Not Specified Elsewhere
14949 County Hwy S STE 2, Chippewa Falls, WI 54729
14949 County Hwy S, Eau Claire, WI 54729
(715) 834-6659, (715) 738-1992, (715) 834-8269

Publications

Us Patents

Method For Using Photoabsorptive Coatings And Consumable Copper To Control Exit Via Redeposit As Well As Diameter Variance

View page
US Patent:
6023041, Feb 8, 2000
Filed:
Nov 8, 1996
Appl. No.:
8/747095
Inventors:
David B. Noddin - Eau Claire WI
Assignee:
W.L. Gore & Associates, Inc. - Newark DE
International Classification:
B23K 2600
US Classification:
21912171
Abstract:
A method of forming a through-via in a laminated substrate by applying a polymeric photo-absorptive layer on an exposed bottom surface of a laminated substrate. A through-via is laser drilled in the substrate from a top of the substrate through the substrate to a bottom of the substrate. The photo-absorptive layer formed on the bottom surface of the substrate is then removed.

Multiple Frequency Processing To Minimize Manufacturing Variability Of High Aspect Ratio Micro Through-Vias

View page
US Patent:
61039926, Aug 15, 2000
Filed:
Nov 8, 1996
Appl. No.:
8/745241
Inventors:
David B. Noddin - Eau Claire WI
Assignee:
W. L. Gore & Associates, Inc. - Newark DE
International Classification:
B23K 2600
US Classification:
21912171
Abstract:
A method for forming a through-via in a laminated substrate by laser drilling the through-via in a laminated substrate from a top exposed surface of the substrate to a bottom exposed surface of the substrate using a plurality of laser pulses that are trepanned in a first predetermined pattern. Each pulse trepanned in the first predetermined pattern has a first energy density per pulse. Then, the through-via is laser drilled using a plurality of laser pulses that are trepanned in a second predetermined pattern. Each pulse trepanned in the second predetermined pattern has a second energy density per pulse that is greater than the first energy density per pulse. The second predetermined pattern is within the first predetermined pattern.

Constraining Ring For Use In Electronic Packaging

View page
US Patent:
58797866, Mar 9, 1999
Filed:
Nov 8, 1996
Appl. No.:
8/745592
Inventors:
John J. Budnaitis - Eau Claire WI
Paul J. Fischer - Eau Claire WI
David A. Hanson - Altoona WI
David B. Noddin - Eau Claire WI
Mark F. Sylvester - Eau Claire WI
William George Petefish - Eau Claire WI
Assignee:
W. L. Gore & Associates, Inc. - Newark DE
International Classification:
B32B 900
H01L 23053
US Classification:
428209
Abstract:
A constraining ring increases the modulus of an interconnect substrate to maintain flatness of the substrate. The constraining ring is made of materials selected to match the coefficient of thermal expansion of the substrate to that of the constraining ring. Circuit components including capacitors and resistors are formed on the constraining ring to provide enhanced electrical properties without adding to the size of the device.

Multiple Frequency Processing To Minimize Manufacturing Variability Of High Aspect Ratio Micro Through-Vias

View page
US Patent:
61328537, Oct 17, 2000
Filed:
Jun 24, 1999
Appl. No.:
9/339789
Inventors:
David B. Noddin - Eau Claire WI
Assignee:
W. L. Gore & Asssociates, Inc. - Newark DE
International Classification:
B32B 300
US Classification:
428209
Abstract:
A method for forming a through-via in a laminated substrate by laser drilling the through-via in a laminated substrate from a top exposed surface of the substrate to a bottom exposed surface of the substrate using a plurality of laser pulses that are trepanned in a first predetermined pattern. Each pulse trepanned in the first predetermined pattern has a first energy density per pulse. Then, the through-via is laser drilled using a plurality of laser pulses that are trepanned in a second predetermined pattern. Each pulse trepanned in the second predetermined pattern has a second energy density per pulse that is greater than the first energy density per pulse. The second predetermined pattern is within the first predetermined pattern.

Multiple Frequency Processing To Minimize Manufacturing Variability Of High Aspect Ratio Micro Through-Vias

View page
US Patent:
62038915, Mar 20, 2001
Filed:
Feb 22, 2000
Appl. No.:
9/507821
Inventors:
David B. Noddin - Eau Claire WI
Assignee:
W. L. Gore & Associates, Inc. - Newark DE
International Classification:
B32B 300
US Classification:
428209
Abstract:
A method for forming a through-via in a laminated substrate by laser drilling the through-via in a laminated substrate from a top exposed surface of the substrate to a bottom exposed surface of the substrate using a plurality of laser pulses that are trepanned in a first predetermined pattern. Each pulse trepanned in the first predetermined pattern has a first energy density per pulse. Then, the through-via is laser drilled using a plurality of laser pulses that are trepanned in a second predetermined pattern. Each pulse trepanned in the second predetermined pattern has a second energy density per pulse that is greater than the first energy density per pulse. The second predetermined pattern is within the first predetermined pattern.

Method Of Increasing Package Reliability By Designing In Plane Cte Gradients

View page
US Patent:
61272507, Oct 3, 2000
Filed:
Nov 20, 1998
Appl. No.:
9/196681
Inventors:
Mark F. Sylvester - Eau Claire WI
David B. Noddin - Eau Claire WI
Assignee:
W. L. Gore & Associates, Inc. - Newark DE
International Classification:
H01L 2120
US Classification:
438584
Abstract:
A method of manufacturing a multi-layered structure includes forming first and second layers, patterning the first layer, determining a distribution of material in at least one area of the first layer, and altering the material content of one of the first and second layers in at least one of the first layer area and a corresponding area of the second layer to approximately match the material content of the first layer and second layers.

Method To Correct Astigmatism Of Fourth Yag To Enable Formation Of Sub 25 Micron Micro-Vias Using Masking Techniques

View page
US Patent:
58689508, Feb 9, 1999
Filed:
Nov 8, 1996
Appl. No.:
8/748111
Inventors:
David B. Noddin - Eau Claire WI
Assignee:
W. L. Gore & Associates, Inc. - Newark DE
International Classification:
B44C 122
US Classification:
216 18
Abstract:
A method of forming a via in a laminated substrate by placing a first mask between an output optics of a laser and an exposed surface of a laminated substrate. The first mask has a first aperture corresponding to a location of a via in the substrate. A second mask is placed between the first mask and the output optics of the laser. The second mask has a second aperture disposed within a main beam of a laser beam output from the laser and blocks side lobes of the laser beam from reaching the exposed surface of the substrate.

Multiple Frequency Processing To Improve Electrical Resistivity Of Blind Micro-Vias

View page
US Patent:
57310475, Mar 24, 1998
Filed:
Nov 8, 1996
Appl. No.:
8/746425
Inventors:
David B. Noddin - Eau Claire WI
Assignee:
W.L. Gore & Associates, Inc. - Newark DE
International Classification:
B05D 302
C08J 718
US Classification:
427555
Abstract:
A method of forming a blind-via in a laminated substrate by forming a first conductive layer. A dielectric layer is then formed on the first conductive layer. An exposed second conductive layer is formed on the dielectric layer, with the second conductive layer having a preformed aperture. The dielectric layer is laser drilled through to the first conductive layer to form a blind-via at a location within the preformed aperture of the second conductive layer using a plurality of laser pulses. Each laser pulse has a first energy density per pulse that is greater than an ablation threshold of the dielectric layer and less than an ablation threshold of the first conductive layer. The first conductive layer is then laser drilled for a predetermined number of pulses. Each of the predetermined number of pulses has a second energy density per pulse that is greater than an ablation threshold of the first conductive layer. The predetermined number of pulses cause the surface of the first conductive layer exposed by the laser drilling to become molten.
David Brien Noddin from Earleville, MD, age ~62 Get Report