David A Bruno

50347497, Jul 23, 1991

Sep 21, 1989

7/410315

John R. Jungblut - Escondido CA
David A. Bruno - San Diego CA

Electro Scientific Industries, Inc. - Portland OR

G01R 1512

324158F

The apparatus (20) includes electrically conductive contacts (44, 54) that are spaced apart a distance slightly less than the distance between the terminals (34, 36) formed on the components (24) to be tested. One contact (54) is held in position by a spring (112). The other contact (44) is stationary. The contacts (44, 54) slide against the terminal surfaces (52, 56) of the components (24) that are conveyed into a test location (26) between the contacts. The apparatus employs few moving parts and the sliding motion of the contacts (44, 54) against the terminal surfaces (52, 56) ensures that the contacts (44, 54) penetrate any oxide layer present on the terminal surfaces (52, 56). In an alternative embodiment (160), two sets of contacts (44L, 44T, 54L, 54T) are employed for testing components (24) in two adjacent test locations (26L, 26T). One configuration of a movable contact (304) is such that minimal force is applied to the terminal surfaces (52, 56) of the components (24) so that the components may be tested without marking or damaging the surfaces (52, 56).

50577727, Oct 15, 1991

May 29, 1990

7/531077

David A. Bruno - San Diego CA
John T. Gross - San Diego CA

Electro Scientific Industries, Inc. - Portland OR

G01R 2704

324158P

A system (100) performs concurrent testing and lead verification of an electronic component (104) having two leads (126 and 128). The system includes circuitry (114 and 116) for determining a sum of amounts of contact resistances between first (132) and second (134) probes and one of the leads by producing a current (I. sub. 1) that propagates through the first probe, the lead of the component, and the second probe. The sum of the contact resistances is proportional to the difference in voltage between the leads. If the difference exceeds a limit, then the sum of the amount of contact resistances is excessive. The system also includes circuitry (110) for determining a value of a parameter of the component while the sum of the amounts of contact resistances is being determined. The circuit for determining the sum of the contract resistances and the circuitry for determining the value of the parameter are electrically isolated from each other so that they do not influence each other.