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David J Ballo

from Santa Rosa, CA
Age ~66

David Ballo Phones & Addresses

  • 3832 Alta Vista Ave, Santa Rosa, CA 95409 (707) 576-0612
  • Jenner, CA
  • Bellevue, WA
  • 3832 Alta Vista Ave, Santa Rosa, CA 95409 (707) 290-1512

Work

Company: Keysight technologies Nov 2014 Position: Senior rf application development engineer

Education

Degree: Bachelors, Bachelor of Science In Electrical Engineering School / High School: University of Washington 1976 to 1980 Specialities: Electrical Engineering

Skills

Rf • Microwave • Analog • Electronics • Network Analyzer • Test Equipment • Semiconductors • Product Marketing • Electrical Engineering • Testing • R&D • Technical Writing • Radio Frequency • Wireless • Noise Figure Meter • Product Management • Product Development • Cross Functional Team Leadership • Nvna • Calming • Manufacturing • Research and Development

Industries

Electrical/Electronic Manufacturing

Resumes

Resumes

David Ballo Photo 1

Senior Rf Application Development Engineer

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Location:
44460 Osgood Rd, Fremont, CA 94539
Industry:
Electrical/Electronic Manufacturing
Work:
Keysight Technologies
Senior Rf Application Development Engineer

Agilent Technologies Nov 1999 - Oct 2014
Senior Rf Application Engineer

Hewlett-Packard 1980 - 1999
R and D and Marketing Engineer
Education:
University of Washington 1976 - 1980
Bachelors, Bachelor of Science In Electrical Engineering, Electrical Engineering
Skills:
Rf
Microwave
Analog
Electronics
Network Analyzer
Test Equipment
Semiconductors
Product Marketing
Electrical Engineering
Testing
R&D
Technical Writing
Radio Frequency
Wireless
Noise Figure Meter
Product Management
Product Development
Cross Functional Team Leadership
Nvna
Calming
Manufacturing
Research and Development

Publications

Us Patents

Triggered Narrow-Band Method For Making Pulsed-Rf Networking Measurements

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US Patent:
20060158174, Jul 20, 2006
Filed:
Jan 19, 2005
Appl. No.:
11/038345
Inventors:
Michael Marzalek - Santa Rosa CA, US
David Ballo - Santa Rosa CA, US
International Classification:
G01R 23/00
US Classification:
324076190
Abstract:
A method of measuring a device under test (“DUT”) includes applying a pulsed-RF input signal to the DUT and coupling an output of the DUT to a receiver having an output bandwidth selected to measure a center tone in an RF pulse response spectrum from the output of the DUT. The receiver is triggered so as to sample data output from the DUT during a window period, and stops taking data after the window period.
David J Ballo from Santa Rosa, CA, age ~66 Get Report