Work:
The Ohio State University
2014 to 2000
Postdoctoral Researcher
Louisiana State univeristy
Baton Rouge, LA
Aug 2005 to Jun 2013
Research Assistant
Lousiana State Univeristy
Baton Rouge, LA
Aug 2011 to May 2013
Teaching Assistant
Optical Measurement and Device Laboratory
2007 to 2011
Research Assistant
Electronic Device and Material Laboratory
2005 to 2006
Research Assistant
Education:
Louisiana State University
Aug 2013
Ph.D. in Electrical Engineering
Louisiana State University
2007
M.S. in Electrical Engineering
University of Louisiana at Lafayette
Lafayette, LA
2004
B.S. in Computer Engineering
Skills:
SKILLS Optics and Electro-Optics: Laser and Detector Alignment and Characterization, Polarizing beam splitter, quarter wave plate, mirrors, and liquid crystal cell assembly, alignment, tolerances, losses, cross-talk response time, etc. UV curing transparent epoxy characterization. Electronics system for stage and system testing Theoretical Device Modeling: Optical device, stage, and system physical modeling and digital algorithm for controlling the system Software: C++, C, Assembly, MATLAB, PSpice, Cadance, LabView, HTML Lithography: E-beam, X-ray, and UV for grey scale, contact, and project exposure systems. Thin Film Deposition: Spin coating, screen printing, chemical vapor deposition (CVD), PECVD, oxidation furnace, and annealing for silicon, thick and thin glass surfaces, and concave substrates Metal Deposition: DC/RF Sputtering, Thermal Evaporation, and E-beam evaporation Class 100 Clean room Training and Experience at CAMD and the EMDL laboratory Etching: Glass (HF), Metal (gold, copper, aluminum, etc.), silicon, etc. using chemicals or reactive ion etching Measurement and Characterization: Ellipsometer, Four Point Probe, AFM, SEM, Alpha Step Profiler, Alessi Probing, Raman Spectroscopy System, Multi-Frequency LCR Meter, Pa Meter DC Voltage source, WYKO Surface Profiler Measurement Tools for Optics: Insertion, alignment, and angular losses in fiber optic networks. Measurement of beam width of a laser, measurement of the focal length, magnification and resolution of a telescope and microscope. Laser diffraction, etc. Measurement for Electronic Circuits: Oscilloscope , Full-function prototype board , Function generator, Curve tracer, Frequency counter