US Patent:
20190080146, Mar 14, 2019
Inventors:
- Schenectady NY, US
Qing Li - Schenectady NY, US
Yunxia Sui - Clifton Park NY, US
Dmitry Vladimirovich Dylov - Clifton Park NY, US
Christopher James Sevinsky - Watervliet NY, US
Michael E. Marino - Albany NY, US
Michael J. Gerdes - Albany NY, US
Daniel Eugene Meyer - Rexford NY, US
Fiona Ginty - Saratoga Springs NY, US
Anup Sood - Clifton Park NY, US
International Classification:
G06K 9/00
G06T 7/33
Abstract:
The subject matter of the present disclosure generally relates to techniques for image analysis. In certain embodiments, various morphological or intensity-based features as well as different thresholding approaches may be used to segment the subpopulation of interest and classify object in the images.