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Chia Te Chen

from Daly City, CA
Age ~47
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Also known as:
Chia T Chen, Chia Min Chen, Chia N Chen, Chia M Chen, Chi W Chen, Chi A Chen, Marcelo Chen
Related to:
Xi Chen
Connected to:
Abre G Chen, 65Adele Chen, 52Adeline K Chen, 39Ai M Chen, 60Ai C Chen, 79Aiping Chen, 63Alen Y Chen, 68Alma Chen, 29Amanda Chen, 44Amanda T Chen, 63

Chia Chen Phones & Addresses

  • Daly City, CA
  • San Mateo, CA
  • San Francisco, CA
  • Salinas, CA
  • Berkeley, CA
  • Plainfield, NJ
  • Holyoke, MA
  • El Cerrito, CA

Resumes

Resumes

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Chia Chen

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Chia Chen

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Mechanical Design Engineer At Foxlink International Inc.

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Position:
Mechanical Design Engineer at Foxlink International Inc.
Location:
San Francisco Bay Area
Industry:
Mechanical or Industrial Engineering
Work:
Foxlink International Inc. since May 2010
Mechanical Design Engineer
Instrument Technology Research Center Oct 2003 - Jul 2008
Assistant Researcher
Education:
University of Southern California 2008 - 2009
Master, Product Development Engineering National Chiao Tung University 2001 - 2003
Master, Mechanical Engineering National Chung Cheng University 1997 - 2001
Bachelor, Mechanical Engineering The Affiliated Senior High School of National Taiwan Normal University （HSNU） 1994 - 1997

Business Records

Name / Title
Company / Classification
Phones & Addresses
Chia Chun Chen
President
American G&D Group
Nonclassifiable Establishments
145 Corte Madera Town Ctr, Corte Madera, CA 94925
75 Mariner Grn Dr, Corte Madera, CA 94925
Chia C. Chen
President
C&S Technologies, Inc
Marketing Consulting Services Software Development · Accountant · Business Management Consultant · Process & Logistics Consulting Svcs
1879 Lundy Ave, San Jose, CA 95131
920 Hillview Ct, Milpitas, CA 95035
(408) 935-8969, (408) 935-8468
Chia Chen
Partner
China Chili Resturant
Eating Place
1868 Fremont Blvd, Seaside, CA 93955
(831) 899-5888
Chia Wei Chen
Managing
Lagos Shore, LLC
Chia H Chen
C&W INTERNATIONAL, LTD
Chia Hung Chen
CAMPUS CONNECTIONS, LLC
Chia Hung Chen
MAGELLAN INVESTMENTS, LLC
Chia Ta Chen
President
KINETIC SPORTS, INC
3211 Wood St, Emeryville, CA 94608

Publications

Us Patents

Multi-Color Fluorescence Analysis With Single Wavelength Excitation

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US Patent:
47452854, May 17, 1988
Filed:
Aug 21, 1986
Appl. No.:
6/898685
Inventors:
Diether J. Recktenwald - Cupertino CA
Chia H. Chen - San Jose CA
Assignee:
Becton Dickinson and Company - Franklin Lakes NJ
International Classification:
G01N 2164
US Classification:
2504581
Abstract:
A method for determining one or more characteristics of particles using multiple fluorescence analysis comprises directing an incident light beam at the particles under analysis. The particles include at least three fluorescent markers each having different emission spectra. The incident light beam causes the excitation of the markers by light at a single wavelength whereby different wavelengths of fluorescence are emitted from the particles. Different fluorescence emissions associated with the particles under analysis are simultaneously detected. This method further includes associating the detected fluorescence with one or more characteristics of the particles. An apparatus is also part of the present invention for carrying out the aforementioned method.

Method And Materials For Calibrating Flow Cytometers And Other Analysis Instruments

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US Patent:
47048913, Nov 10, 1987
Filed:
Aug 29, 1986
Appl. No.:
6/901860
Inventors:
Diether J. Recktenwald - Cupertino CA
Rickie S. Kerndt - Cupertino CA
Michael R. Loken - Los Altos CA
Chia H. Chen - San Jose CA
Assignee:
Becton, Dickinson and Company - Franklin Lakes NJ
International Classification:
G06M 1100
US Classification:
73 1R
Abstract:
A method for calibrating an instrument for using that instrument to obtain at least one light-related signal from particles under analysis comprises directing an incident beam of light at calibration particles having one or more known characteristics related to the particles expected to be analyzed. Both a light signal and a noise signal from the calibration particles are detected. A measurement is made of the ratio of the detected light signal to the detected noise signal, and that measurement is reported. The measured ratio is then compared to a predetermined ratio which represents a threshold for minimum instrument performance. This method further includes adjusting, if the predetermined ratio has not been attained, the operation of the instrument, while the calibration particles are within the incident beam of light, until the measured ratio reaches the predetermined ratio whereby the instrument is calibrated for subsequently obtaining the light signal from particles to be analyzed. A kit of reagents for use in calibrating an instrument for performing two-color analysis of particles and particle standards for calibrating fluorescence analysis instruments are also part of the instant invention.

Method And Materials For Calibrating Flow Cytometers And Other Analysis Instruments

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US Patent:
48679089, Sep 19, 1989
Filed:
Jun 4, 1987
Appl. No.:
7/058206
Inventors:
Diether J. Recktenwald - Cupertino CA
Rickie S. Kerndt - Cupertino CA
Michael R. Loken - Los Altos CA
Chia H. Chen - San Jose CA
Assignee:
Becton, Dickinson and Company - Franklin Lakes NJ
International Classification:
G01N 3348
US Classification:
2524081
Abstract:
A method for calibrating an instrument for using that instrument to obtain at least one light-related signal from particles under analysis comprises directing an incident beam of light at calibration particles having one or more known characteristics related to the particles expected to be analyzed. Both a light signal and a noise signal from the calibration particles are detected. A measurement is made of the ratio of the detected light signal to the detected noise signal, and that measurement is reported. The measured ratio is then compared to a predetermined ratio which represents a threshold for minimum instrument performance. This method further includes adjusting, if the predetermined ratio has not been attained, the operation of the instrument, while the calibration particles are within the incident beam of light, until the measured ratio reaches the predetermined ratio whereby the instrument is calibrated for subsequently obtaining the light signal from particles to be analyzed. A kit of reagents for use in calibrating an instrument for performing two-color analysis of particles and particle standars for calibrating fluorescence analysis instruments are also part of the instant invention.
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Chia Te Chen from Daly City, CA, age ~47 Get Report