Chee Wah Ho

6700956, Mar 2, 2004

Mar 2, 2000

09/517194

Tsung-Yen Dean Chang - Los Altos Hills CA
Chuang Li - Saratoga CA
Chee Hin Ho - San Jose CA
Bin Lang Gu - Sunnyvale CA

Actiontec Electronics, Inc. - Sunnyvale CA

H04M 1100

379 9309, 379 9305

Apparatus and methods are provided for selectively providing telephone service that is either PSTN-based or Internet-based using a standard analog telephone circuit. In a first embodiment, the apparatus comprises a hardware module and associated software for coupling a personal computer or Internet appliance and a standard analog telephone. The apparatus includes a DTMF interface circuit, a subscriber line interface circuit, a ring detection circuit, and an interface circuit for interfacing with the PC or Internet appliance. The apparatus permits the analog telephone to be toggled between an Internet-based telephone mode and a PSTN-network mode by inputting a predetermined sequence of DTMF digits. In alternative embodiments, the apparatus comprises a processor, modem and optionally, analog telephone circuit, to provide a stand-alone or partially-integrated device capable of selectively switching between PSTN-based and Internet-based telephony services.

20040192292, Sep 30, 2004

Jan 27, 2004

10/766621

Tsung-Yen Chang - Los Altos Hills CA, US
Chuang Li - Saratoga CA, US
Chee Ho - San Jose CA, US
Bin Gu - Sunnyvale CA, US

ACTIONTEC ELECTRONICS, INC. - Sunnyvale CA

H04Q007/20
H04M003/42

455/426100, 455/417000, 455/445000

Apparatus and methods are provided for selectively providing telephone service that is either PSTN-based on Internet-based using a standard analog telephone circuit. In a first embodiment, the apparatus comprises a hardware module and associated software for coupling a personal computer or Internet appliance and a standard analog telephone. The apparatus includes a DTMF interface circuit, a subscriber line interface circuit, a ring detection circuit, and an interface circuit for interfacing with the PC or Internet appliance. The apparatus permits the analog telephone to be toggled between an Internet-based telephone mode and a PSTN-network mode by inputting a predetermined sequence of DTMF digits. In alternative embodiments, the apparatus comprises a processor, modem and optionally, analog telephone circuit, to provide a stand-alone or partially-integrated device capable of selectively switching between PSTN-based and Internet-based telephony services.

20110214843, Sep 8, 2011

Apr 6, 2011

13/081439

Nasser Barabi - Lafayette CA, US
Chee Wah Ho - Fremont CA, US
Joven R. Tienzo - Fremont CA, US
Oksana Kryachek - San Francisco CA, US
Elena V. Nazarov - San Mateo CA, US

F28D 15/00

16510433

Thermal control units (TCU) for maintaining a set point temperature on an IC device under test (DUT) are provided. The units include a pedestal assembly comprising a heat-conductive pedestal, a fluid circulation block, a thermoelectric module (Peltier device) between the heat-conductive pedestal and the block for controlling heat flow between the pedestal and fluid circulation block, and a force distribution block for controllably distributing a z-axis force between different pushers of the TCU. Alternatively, instead of a thermoelectric module, a heater can provide heat to the DUT. Optionally, a swivelable temperature-control fluid inlet and outlet arms may be provided to reduce instability of the thermal control unit due to external forces exerted on the TCU such as by fluid lines attached to the fluid inlet and outlet arms. Also optionally, an integrated means for abating condensation on surfaces of the TCU during cold tests may be provided.

20130021049, Jan 24, 2013

Jul 30, 2012

13/562305

Nasser Barabi - Lafayette CA, US
Chee Wah Ho - Fremont CA, US
Joven R. Tienzo - Fremont CA, US
Oksana Kryachek - San Francisco CA, US
Elena V. Nazarov - San Mateo CA, US

G01R 31/26

32475008, 32475602

A device tester for an IC device under test (DUT), the DUT having a substrate and an attached die. The device tester includes a thermal control unit and a test socket assembly which conforms to the DUT's profile. The thermal control unit includes a pedestal assembly, a heater having a fuse coupled to a heating element, a substrate pusher, and a force distributor for distributing force between the pedestal assembly and the substrate pusher. The test socket assembly includes a socket insert that supports and also conforms to the DUT's profile.

20130271170, Oct 17, 2013

Mar 14, 2013

13/830633

Chee Wah Ho - Fremont CA, US
Joven R. Tienzo - Fremont CA, US
Oksana Kryachek - San Francisco CA, US
Elena V. Nazarov - San Mateo CA, US

G01R 31/26

32475008

An integrated circuit (IC) device tester maintains a set point temperature on an IC device under test (DUT) having a die attached to a substrate. The tester includes a thermal control unit and a fluid management system configured to supply the thermal control unit with fluids for pneumatic actuation, cooling, and condensation abating. The tester can includes a box enclosing the thermal control unit thereby providing a substantially isolated dry environment during low humidity testing of the DUT. The heat exchange plate may include an inner structure for thermal conductivity enhancement.

20140015556, Jan 16, 2014

Jul 3, 2013

13/935439

Chee Wah Ho - Fremont CA, US
Joven R. Tienzo - Fremont CA, US
Oksana Kryachek - San Francisco CA, US
Elena V. Nazarov - San Mateo CA, US

G01R 31/28

32475003

A test socket assembly, useful in association with a thermal control unit used to maintain a set point temperature on an IC device under test, has at least one compliant pedestal is configured to facilitate the testing of integrated circuits where the device under test comprises a substrate having multiple IC chips with different heights and testing requirements.

20140021972, Jan 23, 2014

Jul 12, 2013

13/941404

Chee Wah Ho - Fremont CA, US
Joven R. Tienzo - Fremont CA, US
Oksana Kryachek - San Francisco CA, US
Elena V. Nazarov - San Mateo CA, US

Essai, Inc. - Fremont CA

G01R 31/28

32475003

A test socket assembly, useful in association with a thermal control unit (TCU) used to maintain a set point temperature on an IC device under test, has alignment holes with bushings that are secured within the alignment holes by using retaining pins. The retaining pins can be easily screwed in and out of the socket. This provision allows the bushings to be replaced easily as they get worn out or deformed from repeated testing.

20140055154, Feb 27, 2014

Aug 23, 2013

13/975150

Chee Wah Ho - Fremont CA, US
Joven R. Tienzo - Fremont CA, US
Oksana Kryachek - San Francisco CA, US
Elena V. Nazarov - San Mateo CA, US

ESSAI, INC. - Fremont CA

G01R 31/28

32475003

A test pusher assembly, useful in association with a thermal control unit used to maintain a set point temperature on an integrated circuit device under test, is provided with ejection mechanisms configured to facilitate the disengagement of the DUT at the end of the test. One example of the ejection mechanisms is to provide the substrate pusher assembly with spring-loaded pins that can push the substrate of the DUT away from the pedestal at the end of the test. Another example of the ejection mechanisms is to use a pressurized fluid that can push the substrate of the DUT away from the pedestal at the end of the test.