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Caron Y Thor

from Santa Clara, CA
Age ~50

Caron Thor Phones & Addresses

  • 1457 Don Ave, Santa Clara, CA 95050 (408) 858-7411
  • Sunnyvale, CA
  • 148 Sierra Dr, Walnut Creek, CA 94596
  • Pleasanton, CA
  • 951 12Th St, San Jose, CA 95112
  • Tucson, AZ

Work

Company: Apple Feb 2016 Position: Manager, camera frameworks

Education

Degree: Bachelors, Bachelor of Science School / High School: University of California, Berkeley 1999 to 2001 Specialities: Physics, Engineering

Skills

Digital Imaging • Semiconductors • Cmos • Image Processing • Sensors • Debugging • Firmware • Soc • Mixed Signal • Embedded Systems • Asic • Fpga • Digital Signal Processors • Characterization • Ic • Electronics

Industries

Consumer Electronics

Resumes

Resumes

Caron Thor Photo 1

Manager, Camera Frameworks

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Location:
Santa Clara, CA
Industry:
Consumer Electronics
Work:
Apple
Manager, Camera Frameworks

Apple
Software Engineer

Aptina 2008 - Nov 2011
Camera Systems Engineer

Eastman Kodak Sep 2004 - Apr 2006
Cis Characterization Engineer

National Semiconductor Jul 2001 - Sep 2004
Characterization Engineer Cmos Imaging
Education:
University of California, Berkeley 1999 - 2001
Bachelors, Bachelor of Science, Physics, Engineering
Amador Valley High School
Skills:
Digital Imaging
Semiconductors
Cmos
Image Processing
Sensors
Debugging
Firmware
Soc
Mixed Signal
Embedded Systems
Asic
Fpga
Digital Signal Processors
Characterization
Ic
Electronics

Publications

Us Patents

Method For Reducing Dark Current For An Array Of Active Pixel Sensor Cells

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US Patent:
7053354, May 30, 2006
Filed:
May 24, 2004
Appl. No.:
10/853806
Inventors:
Qiang Luo - Santa Clara CA, US
Eric Staton - San Francisco CA, US
Christina Phan - San Jose CA, US
Caron Yvonne Thor - San Jose CA, US
Edith Kwong - San Francisco CA, US
Chris Papalias - Emerald Hills CA, US
Assignee:
Eastman Kodak Company - Rochester NY
International Classification:
H01L 27/00
US Classification:
2502081, 348297
Abstract:
An array of active pixel sensor cells is operated to substantially reduce the gate induced drain leakage (GIDL) current component of the dark current. In addition, the array is tested to determine the number of cells in the array that are bad, and discards the array of active pixel sensor cells when the number of bad cells exceeds a predefined limit.
Caron Y Thor from Santa Clara, CA, age ~50 Get Report