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Bruce Pellegrino Phones & Addresses

  • 6 Winston Farm Ln, Far Hills, NJ 07931
  • New York, NY
  • Flanders, NJ
  • Mendham, NJ
  • Morristown, NJ
  • Morris Plains, NJ
  • Skaneateles Falls, NY
  • 4 Springcroft Rd, Far Hills, NJ 07931

Work

Company: G e inspection technologies, lp Address: 199 Us Highway 206, Roxbury Township, NJ 07836 Phones: (973) 448-0077 Position: Partner chief executive officer Industries: Equipment Rental and Leasing

Industries

Research

Public records

Vehicle Records

Bruce Pellegrino

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Address:
4 Springcroft Rd, Far Hills, NJ 07931
Phone:
(908) 665-1611
VIN:
WBAEK13527CN72531
Make:
BMW
Model:
6 SERIES
Year:
2007

Resumes

Resumes

Bruce Pellegrino Photo 1

Gov Relations Leader At Ge Sensing & Inspection

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Location:
Greater New York City Area
Industry:
Research

Business Records

Name / Title
Company / Classification
Phones & Addresses
Bruce Pellegrino
Partner Chief Executive Officer
G E Inspection Technologies, Lp
Equipment Rental and Leasing
199 Us Highway 206, Roxbury Township, NJ 07836
Bruce Pellegrino
EVEREST VIT, INC
199 Hwy 206, Flanders, NJ 07836
Bruce Pellegrino
Branch Manager
G E Inspection Technologies, Lp
Mfg X-Ray Apparatus/Tubes Mfg Measuring/Controlling Devices
199 Us Hwy 206, Roxbury Township, NJ 07836
(973) 448-0077
Bruce Pellegrino
Director, President
EVEREST VIT, INC
PO Box 2216, Schenectady, NY 12301
199 Hwy 206, Flanders, NJ 07836
Bruce Pellegrino
P, Director
VISUAL INSPECTION TECHNOLOGIES INC
199 Us Hwy 206 C/O Mac Mather, Flanders, NJ 07836
199 Us Hwy 206, Flanders, NJ 07836

Publications

Us Patents

Inspection Apparatus For Inspecting Articles

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US Patent:
8310533, Nov 13, 2012
Filed:
Dec 22, 2006
Appl. No.:
11/645073
Inventors:
Bradford Morse - Syracuse NY, US
Thomas Eldred Lambdin - Auburn NY, US
Clark A. Bendall - Syracuse NY, US
Edward B. Hubben - Skaneateles NY, US
Thomas W. Karpen - Skaneateles NY, US
Bruce A. Pellegrino - Far Hills NJ, US
Assignee:
GE Sensing & Inspection Technologies, LP - Schenectady NY
International Classification:
H04N 7/18
H04N 5/76
H04N 7/12
G01N 21/00
G06F 9/44
US Classification:
348 92, 3482313, 37524001, 3562411, 3562415, 717100
Abstract:
An inspection apparatus can include an application guiding an inspector in the performance of an inspection. The application can be provided in such form as to be modified. In one embodiment, an application for guiding an inspector can be modified responsively to data collected by an inspection apparatus of an inspection system. In one embodiment an application for guiding an inspector can be modified responsively to data output by a data output device.

Article Inspection Apparatus

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US Patent:
8368749, Feb 5, 2013
Filed:
Dec 22, 2006
Appl. No.:
11/645082
Inventors:
Thomas Eldred Lambdin - Auburn NY, US
Bradford Morse - Syracuse NY, US
Clark A. Bendall - Syracuse NY, US
Edward B. Hubben - Skaneateles NY, US
Thomas W. Karpen - Skaneateles NY, US
Bruce A. Pellegrino - Far Hills NJ, US
Assignee:
GE Inspection Technologies LP - Schenectady NY
International Classification:
H04N 7/18
US Classification:
348 92
Abstract:
An inspection apparatus can be operated to collect files during performance of an inspection. An inspection apparatus can associate metadata to a collected file. In one embodiment metadata associated with a collected file can include an article identifier. In one embodiment metadata that is associated with a collected file can include data input into an inspection apparatus by an inspector. In one embodiment metadata that is associated with a collected media file can include sensor output data. An inspection apparatus in one embodiment can include an application guiding an inspector in the performance of an inspection.

Imaging Apparatus And Method

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US Patent:
20030016285, Jan 23, 2003
Filed:
Apr 30, 2002
Appl. No.:
10/135865
Inventors:
Jeffrey Drost - Flanders NJ, US
Bruce Pellegrino - Far Hills NJ, US
International Classification:
G06F007/00
US Classification:
348/125000, 701/029000, 701/030000
Abstract:
An inspection system comprising: (a) a moveable inspection device comprising an imaging device and a range finder, the imaging device comprising a lens assembly which is adapted to define a particular field of view, and an optical converter for converting an image of an object captured within the particular field of view into image data and for transmitting the image data on an image signal, the range finder being adapted for determining the distance from the imaging device to a point within the particular field of view and for transmitting distance data on a range signal; (b) a base station communicatively coupled to the imaging device for receiving the image signal and the range signal, the base station having an image display device for displaying an image based on the image data; and (c) a measurement system comprising a processing unit which is configured to calculate measurement data corresponding to the dimensions of the object based upon the distance data and the field of view.

Inspection System And Method

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US Patent:
20040160600, Aug 19, 2004
Filed:
Feb 19, 2003
Appl. No.:
10/369330
Inventors:
Jeffrey Drost - Flanders NJ, US
Bruce Pellegrino - Far Hills NJ, US
International Classification:
G01N021/00
US Classification:
356/241100
Abstract:
A process for maintaining an area using a non-invasive inspection device, the inspection device comprising at least: an imaging system having an adjustable field of view and an imaging device for transmitting an electrical signal corresponding to an area within the field of view; a portable support system operatively connected to the imaging system and adapted to provide functional support to the imaging system; and a positioning system connected to the imaging system and adapted for moving the imaging system independently of the portable support system; the process comprising: (a) positioning the imaging system independently of the support system such that a target area is in the field of view while at a first magnification level; (b) imaging a the target area at a second magnification level greater than the first magnification level; (c) outputting an image of the target area; (d) evaluating the image to determine whether the target area is acceptable or whether an invasive procedure needs to be performed; and (e) performing the invasive procedure on the target area if needed.

Inspection System And Method

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US Patent:
20090180110, Jul 16, 2009
Filed:
Jan 21, 2009
Appl. No.:
12/357273
Inventors:
Jeffrey D. Drost - Flanders NJ, US
Bruce A. Pellegrino - Far Hills NJ, US
Richard Lindner - Warren NJ, US
Assignee:
ENVIROSIGHT LLC - Randolph NJ
International Classification:
G01N 21/00
US Classification:
3562411
Abstract:
A method of inspecting a lateral pipe extending from a manhole, said method comprising: (a) inserting an imaging head into said manhole using a positioning system, said imaging head connected to an elongated member and comprising an imaging device adapted to convert an image to an image signal, a lens optically coupled to said imaging device, and at least one lamp suitable for projecting a light beam, said lamp having a beam that is adjustable to enable said beam to move relative said imaging device; (b) imaging a target located within said lateral pipe; (c) holding said imaging device essentially steady while imaging said target and adjusting said beam to adjust the illumination of said target.

Tracking Defects With Permanently Installed Sensors

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US Patent:
20180196013, Jul 12, 2018
Filed:
Jan 9, 2018
Appl. No.:
15/865829
Inventors:
- Boalsburg PA, US
Bruce A. Pellegrino - Far Hills NJ, US
International Classification:
G01N 29/265
G01S 5/18
G01N 29/44
G01B 17/02
G01N 29/24
G01N 29/22
G01N 29/34
Abstract:
A method of monitoring defects in a structure, the method comprising the steps of: (a) detecting the potential for a defect in the structure using a first detection method; (b) identifying the location on the structure of the defect using a second detection method; (c) determining if the defect exceeds an allowable limit, and, if so, transmitting information that the structure needs to be repaired; (d) if the defect does not exceed the allowable limit, then monitoring the structure by applying permanently installed ultrasonic sensor to the location; and (e) after step (d), repeatedly performing step (c) until the defect exceeds the allowable limit.
Bruce A Pellegrino from Far Hills, NJ, age ~69 Get Report