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Bruce A Blandin

from Hampton, NH
Age ~70
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Related to:
Brian R Guay, 55Nick Blandin, 27
Connected to:
Alan E Blanding, 76Anna J Blanding, 35Anne C Blandin, 85Barbara Y Blandino, 72Christopher W Blandin, 64Colleen T Blanding, 70Cristian J Blandin, 34Dolores A Blandino, 79Donald J Blandina, 75Ebony N Blanding, 39

Bruce Blandin Phones & Addresses

  • Hampton, NH
  • 19 Reverend Houston Dr, Bedford, NH 03110 (603) 472-9956
  • 32 Geneva St, Manchester, NH 03102 (603) 471-1407
  • Hooksett, NH
  • Vacaville, CA
  • Clearwater, FL

Work

Company: Justice resource institute Sep 2008 Position: Teacher

Education

Degree: Bachelors School / High School: University of Massachusetts Lowell 2002 to 2004 Specialities: Psychology

Languages

English

Emails

b***[email protected]

Industries

Health, Wellness And Fitness

Resumes

Resumes

Bruce Blandin Photo 1

Teacher

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Location:
19 Reverend Houston Dr, Bedford, NH 03110
Industry:
Health, Wellness And Fitness
Work:
Justice Resource Institute
Teacher
Education:
University of Massachusetts Lowell 2002 - 2004
Bachelors, Psychology University of Massachusetts Lowell 1977 - 1980
Bachelors, Electronics Engineering
Languages:
English

Business Records

Name / Title
Company / Classification
Phones & Addresses
Bruce A. Blandin
President
THERMO CHAMBERS, INC
40 Wedgewood Rd, Lawrence, MA 01843

Publications

Us Patents

Method And Apparatus For The Testing Of Active Or Passive Electrical Devices In A Sub-Zero Environment

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US Patent:
47822910, Nov 1, 1988
Filed:
Oct 4, 1985
Appl. No.:
6/784390
Inventors:
Bruce A. Blandin - Hampton NH
International Classification:
G01R 3102
G01R 3128
US Classification:
324158F
Abstract:
A batch processing system and unit for testing electrical components in a sub-zero environment includes an isothermal chamber which mates easily with the test heads associated with conventional automatic testing equipment and which eliminates thermal gradients and variable test conditions as well as eliminating frost contamination of test heads, costly fixturing for the various types of semiconductor chip packages or passive components and static charge. The utilization of a single isothermal soak chamber provides that all devices under test and a test socket mounted on a card secured to a fixture at the bottom of the chamber are cooled to the same temperature by moisture-free gas introduced into the chamber. It is a feature of the subject invention that the test head, located outside the chamber, is well insulated from the chamber. The chamber, with all internal parts and devices, is cooled down until all parts are at the same temperature.
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Bruce A Blandin from Hampton, NH, age ~70 Get Report