Inventors:
James Craig Ziegler - Plympton MA, US
Roy Miles - Morgan Hill CA, US
Brent Schusheim - Wenham MA, US
Assignee:
LTX Corporation - Norwood MA
International Classification:
G01R 31/28
US Classification:
714715, 714701, 714724, 708209
Abstract:
A digital tester includes a digital data pattern aligner. The digital data pattern aligner includes an alignment pattern source, a data shifter, and a data comparator. The alignment pattern source sends an alignment pattern to the comparator in a data stream. The comparator samples the data stream and compares the samples to a copy of the alignment pattern. The shifter shifts the data in the data stream so long as the comparator detects no match between a data stream sample and the copy of the alignment pattern. When a match is detected, the pattern source and the comparator are in alignment and other data, such as test patterns, may be sent to the comparator or associated components.