Resumes
Resumes
Benjamin Haass Phones & Addresses
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6071 County Road 50, Fort Collins, CO 80524 (970) 484-1880
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807 Biscay Ln, Fort Collins, CO 80525
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4470 Lemay Ave, Fort Collins, CO 80525
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5309 Cosmos Ct, Raleigh, NC 27613 (919) 676-1860
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1312 Winter Walk Cir, Morrisville, NC 27560 (919) 462-9608
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Casper, WY
Publications
Us Patents
Circuits, Systems And Methods For Adjusting Clock Signals Based On Measured Performance Characteristics
View pageUS Patent:
20110249525, Oct 13, 2011
Filed:
Apr 9, 2010
Appl. No.:
12/757336
Inventors:
Benjamin J. Haass - Raleigh NC, US
William J. McAvoy - Raleigh NC, US
William J. McAvoy - Raleigh NC, US
Assignee:
QUALCOMM INCORPORATED - San Diego CA
International Classification:
G11C 8/00
H03L 7/00
H03L 7/00
US Classification:
3652331, 327141, 327161
Abstract:
Circuits, systems, and related methods to measure a performance characteristic(s) associated with a semiconductor die and adjust a clock signal based on the measured performance characteristic(s) are provided. The adjusted clock signal can be used to provide a clock signal to a functional circuit provided in the semiconductor die to assure proper operation of the functional circuit while operating with performance, voltage, temperature (PVT) delay variations. In this regard, a performance monitoring circuit is provided in the semiconductor die that includes the functional circuit. As a result, the performance monitoring circuit may be exposed to similar delay variations as the functional circuit. The performance monitoring circuit is configured to measure a performance characteristic(s) associated with the semiconductor die. The performance characteristic(s) is used to adjust a clock signal to provide an adjusted clock signal to the functional circuit for proper operation based on the performance characteristic(s).
System And Method For Testing Devices
View pageUS Patent:
20050024064, Feb 3, 2005
Filed:
Aug 1, 2003
Appl. No.:
10/632270
Inventors:
Benjamin Haass - Ft. Collins CO, US
Douglas Stirrett - Ft. Collins CO, US
James Wai - Ft. Collins CO, US
Douglas Stirrett - Ft. Collins CO, US
James Wai - Ft. Collins CO, US
International Classification:
G01R027/00
US Classification:
324600000
Abstract:
A device testing system comprising automated test equipment (ATE) configured to interface to a device under test (DUT) and logic configured to select a test set of data comprising a plurality of test pairs, the test pairs indicative of DUT parameter values, the logic further configured to select a subset of the plurality of test pairs from the test set of data and to test the DUT via the ATE with a portion of the selected subset based upon the test results of at least one of the test pairs.