US Patent:
20090027077, Jan 29, 2009
Inventors:
Rajesh Vijayaraghavan - Austin TX, US
Benjamin Ertle - Austin TX, US
James E. Routh - Austin TX, US
Paul A. Ferno - Dripping Springs TX, US
International Classification:
G01R 31/26
Abstract:
A method includes performing burn-in testing of a device in a tester to generate post burn-in data. Pre-burn-in data associated with the device is compared to the post burn-in data. The device is identified as an outlier device based on the comparison.