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Andre Miller Phones & Addresses

  • Avondale, AZ
  • Cleveland, OH
  • Lorain, OH
  • Portland, OR
  • West Linn, OR
  • Yacolt, WA
  • Happy Valley, OR
  • Batavia, NY

Resumes

Resumes

Andre Miller Photo 1

Andre Miller Portland, OR

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Work:
Marvel Films /Summit Entertainment
Cleveland, OH
Jun 2011 to Mar 2013
Film/TV Background- Extra Production Assistant

Lyons Production
Ciudad de Mxico, D. F.
Aug 2009 to May 2011
Executive Assistant/ Personal Assistant

Dumas Marketing Group
New York, NY
Jun 2006 to Dec 2007
Executive Assistant

Education:
Santa Rosa College
Santa Rosa, CA
2007 to 2009
AA in Communication

Andre Miller Photo 2

Andre Miller South Euclid, OH

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Work:
Summit Entertainment/ Extreme Productions
Portland, OR
Jun 2011 to May 2014
Film/TV Background- Extra Production Assistant

Lyons Production
Los Angeles, CA
Aug 2008 to May 2011
Executive Assistant/ Personal Assistant

Dumas Marketing Group
New York, NY
Jun 2006 to Dec 2007
Executive Assistant

Education:
Santa Rosa College
Santa Rosa, CA
2007 to 2009
Associates in Film Production

Military:
Rank: E-5 May 2009 to 2000
Branch: U.S. Army
L.i.location.original
Skills:
3+ years of experience in the same field. Able to work with producer, director and production team. Able to deal with producer request and requirement of any task. Ability to keep accurate shot lists of drama production and other. Able to deal with production enquiries. Excellent ability to type up camera scripts and shot cards with design idea of method. Excellent communication and writing skills. Proficient with computer literate such as Microsoft Word, Microsoft Excel, Power point and Internet. Able to manage contracts with external organizations. Responsible for other duties as assigned. Computer skills: Proficient with -MS Office -Internet -Powerpoint -Microsoft Excel

Business Records

Name / Title
Company / Classification
Phones & Addresses
Andre Miller
VIXEON, LLC
Andre B. Miller
ABUNDANT INVESTMENTS, LLC

Publications

Us Patents

Measuring Elastic Moduli Of Dielectric Thin Films Using An Optical Metrology System

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US Patent:
7019845, Mar 28, 2006
Filed:
Oct 6, 2004
Appl. No.:
10/960351
Inventors:
Sean P. Leary - Lancaster PA, US
Guray Tas - Flanders NJ, US
Christopher J. Morath - Morristown NJ, US
Michael Kotelyanskii - Chatham NJ, US
Tong Zheng - Rockaway NJ, US
Guenadiy Lazarov - Landing NJ, US
Andre D. Miller - Portland OR, US
George A. Antonelli - Portland OR, US
Jamie I. Ludke - Portland OR, US
Assignee:
Rudolph Technologies, Inc. - Flanders NJ
International Classification:
G01B 9/02
G01B 11/28
US Classification:
356504, 356502, 356630
Abstract:
An optical metrology system is provided with a data analysis method to determine the elastic moduli of optically transparent dielectric films such as silicon dioxide, other carbon doped oxides over metal or semiconductor substrates. An index of refraction is measured by an ellipsometer and a wavelength of a laser beam is measured using a laser spectrometer. The angle of refraction is determined by directing a light pulse focused onto a wafer surface, measuring a first set of x, y, and zcoordinates, moving the wafer in the z direction, directing the light pulse onto the wafer surface and measuring a second set of x, yand zcoordinates, using the coordinates to calculate an angle of incidence, calculating an angle of refraction from the calculated angle of incidence, obtaining a sound velocity v, from the calculated angle of refraction and using the determined sound velocity v, to calculate a bulk modulus. Hardware calibration and adjustments for the optical metrology system are also provided in order to minimize the variation of the results from tool to tool down to about 0. 5% or below.
Andre Dion Miller from Avondale, AZ, age ~38 Get Report