Search

Alexei G Vershinin

from Dallas, TX
Age ~40
Get Report
Also known as:
Alexei G Verchinine, Alex Vershinin, Alexei Vershinine, Alexie Verchinine, Alexei I, Alexei E
Phone and address:
4219 W Creek Dr, Dallas, TX 75287
Related to:
Shirley D Gadomski, 94Lillian GadomskiJoseph Gadomski, 83Elena Gadomski, 71
Connected to:
Irene Vershinin, 73William R Vershon, 104Fatema Versi, 34James R Versical, 73John C Versical, 46Butch E Versiga, 68Giulietta C Versiglia, 47Craig Versil, 65Michelle Versino, 45Maria E Versis, 56

Alexei Vershinin Phones & Addresses

  • 4219 W Creek Dr, Dallas, TX 75287
  • The Colony, TX
  • 38 Overland Ave, Schenectady, NY 12304
  • 47 Mercer St, Albany, NY 12203 (518) 427-0252
  • Colonie, NY

Work

Company: X-ray optical systems, inc Jun 2010 Position: Lab manager

Education

School / High School: College of Professional Studies, Northeastern University- Boston, MA Sep 2010 Specialities: Masters of Science in Technology Commercialization

Skills

Computers: OpenProj • Microsoft Office (Excel • PowerPoint • Word • Outlook) • Excel Macros • SolidWorks • Proficient in Origin • Mathematica • SPSS • Microsoft Visual Basic • Linux Mechanical and Electrical: Hands... • wafer testing • polishing and handling • work with designers • drawings • and vendor data to repair any mechanical... • very knowledgeable of data evaluation • statistical analysis • physical and chemical structure of mater... • and possess extensive experience with mo... • XRD • ICP-OES • ICP-AES • AA • DSC • and quality control of solar cells • fuel cells • pharmaceutical drugs • aircraft turbine blades • and semicrystalline polymers used in sup... • wants and desires of a customer • have experience in conducting market res... • and developing Financial Models • PRD • Opportunity Assessment • Project Plan • Risk Management • and Product Requirements Documents

Resumes

Resumes

Alexei Vershinin Photo 1

Alexei Vershinin Schenectady, NY

View page
Work:
X-Ray Optical Systems, Inc

Jun 2010 to Present
Lab Manager
X-Ray Optical Systems, Inc

Nov 2007 to Jun 2010
Research Specialist
X-Ray Optical Systems, Inc

Nov 2005 to Nov 2007
Technician Specialist
State University of New York, Public Libraries
Albany, NY
Feb 2004 to Jan 2006
Information Technology Specialist
Education:
College of Professional Studies, Northeastern University
Boston, MA
Sep 2010
Masters of Science in Technology Commercialization
College of Art and Science, University at Albany
Albany, NY
Dec 2006
Masters of Science in Physics
Skills:
Computers: OpenProj, Microsoft Office (Excel, PowerPoint, Word, Outlook), Excel Macros, SolidWorks, Proficient in Origin, Mathematica, SPSS, Microsoft Visual Basic, Linux Mechanical and Electrical: Hands on problem solver for complex instruments, wafer testing, polishing and handling, work with designers, drawings, and vendor data to repair any mechanical or electrical problems encountered with an instrument, very knowledgeable of data evaluation, statistical analysis, physical and chemical structure of materials, and possess extensive experience with monitoring techniques such as XRF, XRD, ICP-OES, ICP-AES, AA, DSC, and quality control of solar cells, fuel cells, pharmaceutical drugs, aircraft turbine blades, and semicrystalline polymers used in superconductors Business: Possess an ability to comprehend needs, wants and desires of a customer, have experience in conducting market research, and developing Financial Models, PRD, Opportunity Assessment, Project Plan, Risk Management, and Product Requirements Documents

Publications

Us Patents

X-Ray Diffraction Apparatus And Technique For Measuring Grain Orientation Using X-Ray Focusing Optic

View page
US Patent:
20110038457, Feb 17, 2011
Filed:
Feb 23, 2010
Appl. No.:
12/710827
Inventors:
Huapeng HUANG - Ellicott City MD, US
Alexei VERSHININ - Schenectady NY, US
Assignee:
X-RAY OPTICAL SYSTEMS, INC. - East Greenbush NY
International Classification:
G01N 23/207
US Classification:
378 73
Abstract:
An x-ray diffraction apparatus for measuring crystal orientation of a multiple grain sample. An x-ray excitation path is provided having a focusing optic for collecting x-rays from an x-ray source and redirecting the collected x-rays into an x-ray beam converging on a single grain of the multiple grain sample. At least one point detector and the sample are rotated relative to each other; and a grain orientation is obtained based upon diffraction patterns collected from first and second grain crystal planes within the apparatus.
Control profile
Alexei G Vershinin from Dallas, TX, age ~40 Get Report