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Alexandre Kotchkin

from Fair Lawn, NJ
Age ~50
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Also known as:
Kotchkin Alexandre, Alexandre N
Phone and address:
33-03 Halsey Rd, Fair Lawn, NJ 07410
Related to:
Elisaveta Chouliaka, 58Elizaveta Chouliak, 51
Connected to:
Randy J Kotchman, 57John M Kotcho, 77Michele M Kotcho, 61Shrinath J Kotdawala, 59Brandi L Kote, 50Alok N Kotecha, 36Arvind J Kotecha, 62Chiman O Kotecha, 80Jayesh M Kotecha, 54Kush V Kotecha, 46

Alexandre Kotchkin Phones & Addresses

  • 33-03 Halsey Rd, Fair Lawn, NJ 07410
  • Paramus, NJ
  • 75 Oldham Rd, Wayne, NJ 07470
  • Midland Park, NJ
  • Hawthorne, NJ
  • Ridgewood, NJ
  • Hasbrouck Heights, NJ
  • Berlin, NJ

Resumes

Resumes

Alexandre Kotchkin Photo 1

Senior Software Architect

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Location:
75 Oldham Rd, Wayne, NJ 07470
Industry:
Computer Software
Work:
Topcon Medical Systems since Jan 2006
Senior Architect
Education:
Tel Aviv University 1994 - 1997
Bachelors, Computer Science and Mathematics, Computer Science, Mathematics Samara State Aerospace University 1991 - 1993
Skills:
Software Engineering
Object Oriented Design
Software Development
C#
.Net
Databases
Integration
Software Design
C++
Wpf
Visual Studio
Wcf
Programming
Algorithms
Javascript
Xml
Microsoft Sql Server
Web Applications
Oop
Architecture
Angularjs
Jquery
Mobile Applications
Silverlight
Asp.net Mvc
Telerik Web Controls
Html5
Sql
System Architecture
Kineticjs
Webaudio
Webgl
Telerik Platform
Cordova Plugins
Rest
Mvc
Mobile Devices
Design Patterns
Web Services
User Interface
Gui Designing
Angular 2
Ophthalmology
Languages:
English
Hebrew
Russian
Alexandre Kotchkin Photo 2

Alexandre Kotchkin

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Publications

Us Patents

Characterization Of Retinal Parameters By Circular Profile Analysis

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US Patent:
8025407, Sep 27, 2011
Filed:
May 14, 2009
Appl. No.:
12/465724
Inventors:
Yijun Huang - Pleasantville NY, US
Tetsuyoshi Royama - Montvale NJ, US
Alexandre Kotchkin - Ridgewood NJ, US
Assignee:
Topcon Medical Systems, Inc. - Paramus NJ
International Classification:
A61B 3/00
US Classification:
351246
Abstract:
Certain diseases of the retina are diagnosed by circular profile analysis of retinal parameters, such as thickness. Retinal thickness around a user-defined circle on the retina is measured by three-dimensional optical coherence tomography or other ophthalmological techniques. Abnormally thin regions are identified by comparing a measured function of thickness vs. polar angle to a reference function of thickness vs. polar angle. A degree of abnormality is characterized by the ratio of the integral of the measured thickness function to the integral of the reference thickness function over the abnormally thin region, as specified by a range of polar angles.

Retinal Thickness Measurement By Combined Fundus Image And Three-Dimensional Optical Coherence Tomography

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US Patent:
8081808, Dec 20, 2011
Filed:
Oct 31, 2008
Appl. No.:
12/262620
Inventors:
Yijun Huang - Pleasantville NY, US
Tetsuyoshi Royama - Montvale NJ, US
Alexandre Kotchkin - Ridgewood NJ, US
Assignee:
Topcon Medical Systems, Inc. - Oakland NJ
International Classification:
G06K 9/00
A61B 3/10
A61B 3/14
US Classification:
382128, 351205, 351206
Abstract:
Disclosed are method and apparatus for mapping retinal thickness values to a movable measurement grid. A three-dimensional volume dataset acquired from three-dimensional optical coherence tomography is registered to a fundus image by rendering a two-dimensional composite image from the three-dimensional volume dataset and superimposing characteristic features in the two-dimensional composite image upon corresponding characteristic features in the fundus image. A measurement grid is displayed on the two-dimensional composite image. The measurement grid is moved to a region of interest, and retinal thickness values in the region of interest are mapped to sectors within the measurement grid.

Method And Apparatus For Spatially Mapping Three-Dimensional Optical Coherence Tomography Data With Two-Dimensional Images

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US Patent:
8134554, Mar 13, 2012
Filed:
May 4, 2007
Appl. No.:
11/800186
Inventors:
Yijun Huang - Pleasantville NY, US
Alexandre Kotchkin - Ridgewood NJ, US
Tetsuyoshi Royama - Montvale NJ, US
Assignee:
Topcon Medical Systems, Inc. - Oakland NJ
International Classification:
G06T 17/00
US Classification:
345424
Abstract:
Voxel data from a three-dimensional optical coherence tomography (3-D OCT) scan of a retina and pixel data from a two-dimensional (2-D) fundus image are spatially mapped. A 2-D composite image generated from the 3-D OCT data is spatially mapped to a fundus image using spatial indicia common to both images. The 3-D OCT data is then spatially mapped to the fundus image. An image processing system generates cross-correlated graphical representations of 3-D OCT data, subsets of 3-D OCT data, and a fundus image.

Circular Profile Mapping And Display Of Retinal Parameters

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US Patent:
8256897, Sep 4, 2012
Filed:
May 14, 2009
Appl. No.:
12/465750
Inventors:
Yijun Huang - Pleasantville NY, US
Tetsuyoshi Royama - Montvale NJ, US
Alexandre Kotchkin - Ridgewood NJ, US
Assignee:
Topcon Medical Systems, Inc. - Oakland NJ
International Classification:
A61B 3/14
A61B 3/00
US Classification:
351206, 351205, 351246
Abstract:
Certain diseases of the retina are diagnosed by circular profile analysis of retinal parameters, such as thickness. Retinal thickness around a user-defined circle on the retina is measured by various ophthalmological techniques and—+mapped to a circular profile map. The circular profile map does not use segmentation of measurement data into arbitrary arcs, and thickness is mapped to a quasi-continuous range of display bands. The circular profile map is superimposed on a fundus image, or other two-dimensional image of the retina, allowing association of the circular profile map with the presence of blood vessels and other anatomical features. The simultaneous display of a series of circular profile maps generated from sets of measurement data taken at different times permits the ready visualization of the progression of retinal abnormalities.

Mapping Of Retinal Parameters From Combined Fundus Image And Three-Dimensional Optical Coherence Tomography

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US Patent:
8401246, Mar 19, 2013
Filed:
Oct 31, 2008
Appl. No.:
12/262799
Inventors:
Yijun Huang - Pleasantville NY, US
Tetsuyoshi Royama - Montvale NJ, US
Alexandre Kotchkin - Ridgewood NJ, US
Assignee:
Topcon Medical Systems, Inc. - Oakland NJ
International Classification:
G06K 9/00
US Classification:
382117, 351206, 351210, 382128, 382154, 382284
Abstract:
A second retinal characterization data set is mapped to a first retinal characterization dataset. The first retinal characterization dataset is displayed as a first graphical map. The second retinal characterization dataset is displayed as a second graphical map which is mapped to the first graphical map. The second graphical map may be warped and morphed onto the first graphical map. Retinal characterization datasets may be derived either from a fundus image or from a retinal parameter dataset calculated from a three-dimensional optical coherence tomography scan of a retina. Retinal parameter datasets may characterize parameters such as retinal thickness. In an embodiment, a fundus image is warped and morphed onto a retinal surface topographical map.

Characterization Of Retinal Parameters By Circular Profile Analysis

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US Patent:
8567951, Oct 29, 2013
Filed:
Sep 2, 2011
Appl. No.:
13/224568
Inventors:
Yijun Huang - Pleasantville NY, US
Tetsuyoshi Royama - Montvale NJ, US
Alexandre Kotchkin - Ridgewood NJ, US
Assignee:
Topcon Medical Systems, Inc. - Oakland NJ
International Classification:
A61B 3/00
US Classification:
351246
Abstract:
Certain diseases of the retina are diagnosed by circular profile analysis of retinal parameters, such as thickness. Retinal thickness around a user-defined circle on the retina is measured by three-dimensional optical coherence tomography or other ophthalmological techniques. Abnormally thin regions are identified by comparing a measured function of thickness vs. polar angle to a reference function of thickness vs. polar angle. A degree of abnormality is characterized by the ratio of the integral of the measured thickness function to the integral of the reference thickness function over the abnormally thin region, as specified by a range of polar angles.

Characterization Of The Retinal Nerve Fiber Layer

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US Patent:
20090033868, Feb 5, 2009
Filed:
Jul 21, 2008
Appl. No.:
12/176550
Inventors:
Yijun Huang - Pleasantville NY, US
Tetsuyoshi Royama - Montvale NJ, US
Alexandre Kotchkin - Ridgewood NJ, US
Assignee:
TOPCON MEDICAL SYSTEMS, INC. - Paramus NJ
International Classification:
A61B 3/10
US Classification:
351205, 351246
Abstract:
Disclosed are method and apparatus for characterizing the retinal nerve fiber layer (RNFL). An advantageous diagnostic parameter for characterizing the RNFL is a function of the product of the local RNFL thickness at a measurement locus×the distance of the measurement locus from a base point. The value of the diagnostic parameter in a patient's retina is compared to a corresponding reference range acquired from a population of healthy retinas.
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Alexandre Kotchkin from Fair Lawn, NJ, age ~50 Get Report