Albert J Sicignano

48453625, Jul 4, 1989

Feb 2, 1988

7/151367

Albert Sicignano - Mount Kisco NY
Mehdi Vaez-Iravani - Peekskill NY

North American Philips Corporation - New York NY

G01N 2300

250310

The operating characteristics of an SEM apparatus are enhanced by carrying out in situ deflection during electron beam scanning of an object to be examined. Differential signals derived from the in situ deflection are a direct measure of the spatial derivative of any geometric or material variations on the surface of the scanned object.

49298364, May 29, 1990

Apr 3, 1989

7/333059

Albert Sicignano - Mount Kisco NY
Mehdi Vaez-Iravani - Peekskill NY

North American Philips Corporation - New York NY

H01J 3721

250397

A significantly improved focusing technique is set forth for use with electron beams, particularly in scanning electron microscopes and/or CRTs. This technique utilizes an in-situ differential signal measurement of an object surface to form a signal which is particularly sensitive to edges in the sample at a superimposed frequency. Perfect focus is obtained when the signal strength at the superimposed frequency is a maximum thereby resulting in a minimum spot size.

42385296, Dec 9, 1980

Aug 2, 1979

6/063015

Albert Sicignano - Mount Kisco NY
William P. Zingaro - late of Hartsdale NY
Josephine Zingaro - Scarsdale NY

North American Philips Corp. - New York NY

G01N 2320
B05D 120
B05D 136

427160

An x-ray diffraction crystal for the analysis of x-rays comprisng at least two insoluble monolayers of (i) a first divalent metal soap, separated by (ii) at least one monolayer of either a fatty acid alone, or of a second divalent metal soap, the second metal having a lower atomic number than the first metal. Such crystals are formed by alternately raising and lowering a solid substrate through the monolayer-covered liquid surfaces of the first divalent metal cation soap monolayer, and the second divalent metal cation soap monolayer or fatty acid monolayer.