Search

Alan R Sieving

from Waltham, MA
Age ~61

Alan Sieving Phones & Addresses

  • 32 Pleasant St, Waltham, MA 02452 (781) 647-0896
  • 48 Harris St, Waltham, MA 02452 (781) 647-0896
  • 51 Harris St, Waltham, MA 02452 (781) 647-0896
  • Belmont, MA
  • Sun City West, AZ
  • Newtonville, MA
  • 32 Pleasant St, Waltham, MA 02452

Work

Company: Quickware engineering & design, llc. Jul 2005 Position: Electrical engineer

Education

Degree: S.B. School / High School: Massachusetts Institute of Technology 1981 to 1985 Specialities: Electrical Engineering & Computer Science (VI-3)

Skills

Electrical Engineering • Embedded Systems • Assembly • Troubleshooting • Pcb Design • Fpga • Vhdl • Pdp 11 • Xilinx • Integration • Manufacturing • Hardware • Hardware Architecture • Microcontrollers • Digital Signal Processors

Emails

a***g@juno.com

Industries

Computer Hardware

Resumes

Resumes

Alan Sieving Photo 1

Electrical Engineer

View page
Location:
Waltham, MA
Industry:
Computer Hardware
Work:
Quickware Engineering & Design, LLC. since Jul 2005
Electrical Engineer

L-3 Communications 2001 - 2005
Electrical Engineer
Education:
Massachusetts Institute of Technology 1981 - 1985
S.B., Electrical Engineering & Computer Science (VI-3)
GCHS
Skills:
Electrical Engineering
Embedded Systems
Assembly
Troubleshooting
Pcb Design
Fpga
Vhdl
Pdp 11
Xilinx
Integration
Manufacturing
Hardware
Hardware Architecture
Microcontrollers
Digital Signal Processors

Business Records

Name / Title
Company / Classification
Phones & Addresses
Alan R. Sieving
Treasurer
QUICKWARE ENGINEERING & DESIGN, INCORPORATED
1310 Bittersweet Dr, Greenfield, IN 46140
98 Grv St, Belmont, MA
Alan R. Sieving
Manager, Principal
QUICKWARE ENGINEERING & DESIGN, LLC
Business Services
32 Pleasant St, Waltham, MA 02452
48 Harris St, Waltham, MA 02452

Publications

Us Patents

Inspection System With Data Acquisition System Interconnect Protocol

View page
US Patent:
7664015, Feb 16, 2010
Filed:
Oct 20, 2004
Appl. No.:
10/969660
Inventors:
John Price - Brentwood NH, US
Alan Roy Sieving - Waltham MA, US
James Angelo Karon - Medford MA, US
Assignee:
L-3 Communications Security & Detection Systems - Woburn MA
International Classification:
G01R 31/08
G06F 15/16
G06F 11/00
H04B 7/212
US Classification:
370229, 370236, 370444, 709204, 709231
Abstract:
An improved interconnection protocol that is well suited for use in an inspection system or similar modular electronic system. Communication is provided over a network where the electronic modules are nodes, including a root node and multiple remote nodes. The root node and remote nodes are connected through multiple point-to-point synchronous links. The root node and remote nodes are configured to send and receive packets in either a short form or a normal form. Timing between the root node and remote nodes is provided by an external clock distributed by the root node. Each remote node responds to commands with low latency. This protocol allows normal packets to be configured to provide variable payload length, with a maximum payload size that yields a low protocol overhead.

X-Ray Imaging Technique

View page
US Patent:
7369642, May 6, 2008
Filed:
Apr 20, 2004
Appl. No.:
10/554272
Inventors:
Richard F. Eilbert - Lincoln MA, US
Alan R. Sieving - Waltham MA, US
Assignee:
L-3 Communications and Security Detection Systems Inc. - Woburn MA
International Classification:
G01N 23/04
US Classification:
378 57, 378 62, 378 87
Abstract:
A security system for detecting contraband such as explosives. The system has a source of radiation and a detector array. A detector array is made of many small detectors, each with a fast response time. The fast response time allows individual radiation photon interactions with each detector to be counted. By counting the number of interactions in an interval of time, the amount of radiation reaching the detector can be measured. The magnitude of the response from the detector to each radiation interaction allows measurement of the energy level of the photons interacting with the detector. Such a system provides significant flexibility in analyzing data collected from items under inspection. For example, objects such as contraband can be identified within the item under inspection by processing the data to accurately determine both the density and type of material.
Alan R Sieving from Waltham, MA, age ~61 Get Report