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Akihiro Horii Phones & Addresses

  • 25 Marion St, Brookline, MA 02446 (617) 277-3664

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Us Patents

Optical-Scanning Microscope Examination Apparatus

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US Patent:
7852551, Dec 14, 2010
Filed:
Jun 9, 2005
Appl. No.:
11/628762
Inventors:
Mitsuhiro Hara - Musashino, JP
Hiroshi Tosaka - Hachioji, JP
Akihiro Horii - Brookline MA, US
Kazunari Tokuda - Hachioji, JP
Yoshihisa Tanikawa - Tokyo, JP
Assignee:
Olympus Corporation - Tokyo
International Classification:
G02B 21/00
US Classification:
359368, 359385
Abstract:
A clear image having suppressed blurring due to pulsing is obtained by in-vivo examination of biological tissue or various internal organs of mammals, including small laboratory animals. The invention provides an optical-scanning microscope examination apparatus including a light source; a light-transmitting member for transmitting light from the light source; a collimator optical system for converting the transmitted light to a collimated beam; a beam-scanning unit for scanning the collimated beam on a subject; a focusing optical system for focusing the scanned beam onto the subject; a pupil-projection optical system; a light detector for detecting return light returning from the subject via the focusing optical system, the pupil-projection optical system, the beam-scanning unit, the collimator optical system, and the light-transmitting member; an actuator for moving the collimator optical system in an optical-axis direction; a control apparatus for controlling driving thereof; and a deflecting mechanism for deflecting the light issuing from the light-transmitting member in a direction intersecting the optical axis thereof, wherein the actuator is disposed in a space parallel to a plane including optical axes before and after deflection by the deflecting mechanism.
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