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Fong Lin Phones & Addresses

  • San Gabriel, CA
  • Berkeley, CA
  • Monterey Park, CA
  • Diamond Bar, CA
  • 3639 Hawkwood Rd, Diamond Bar, CA 91765 (909) 396-9723

Work

Position: Precision Production Occupations

Professional Records

Lawyers & Attorneys

Fong Lin Photo 1

Fong Lin - Lawyer

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ISLN:
1000537578
Admitted:
1981

Business Records

Name / Title
Company / Classification
Phones & Addresses
Fong Lin
Chief Executive Officer, President
THE CYAN GROUP, INC
Mfg Motor Vehicle Parts/Accessories
1161 N Knollwood Cir, Anaheim, CA 92801
8251 Ln Palma Ave, Buena Park, CA 90620

Publications

Us Patents

Method Of Testing An Integrated Circuit Die, And An Integrated Circuit Die

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US Patent:
7851273, Dec 14, 2010
Filed:
Apr 19, 2010
Appl. No.:
12/762825
Inventors:
Kangping Zhang - Fremont CA, US
Fong Long Lin - Fremont CA, US
Assignee:
Silicon Storage Technology, Inc. - Sunnyvale CA
International Classification:
H01L 21/82
H01L 27/10
US Classification:
438129, 257203
Abstract:
In the present invention, a method of testing an unpackaged integrated circuit die is disclosed. The die has a plurality of first input/output pads. A serial electrical connection is fabricated in the die between all of the input/output pads of the die which are not of the first plurality (hereinafter: “second plurality”). The second plurality has a start input and an end output. The start input of the second plurality is connected to the output of one selected input buffer of the input pad of the first plurality and the end output of the second plurality is also connected to the input of one selected output pad of the first plurality. The second plurality of input/output pads are tested through selected input pad and selected output pad of the first plurality without electrical probes making contact during the wafer sort. The present invention also relates to an integrated circuit die so fabricated as to facilitate testing.

Memory Controller And A Method Of Operating An Electrically Alterable Non-Volatile Memory Device

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US Patent:
20100138588, Jun 3, 2010
Filed:
Dec 2, 2008
Appl. No.:
12/326811
Inventors:
Fong Long Lin - Fremont CA, US
Je-Hurn Shieh - Cupertino CA, US
International Classification:
G06F 12/02
G06F 12/00
US Classification:
711103, 711E12001, 711E12008
Abstract:
A controller operates a NAND non-volatile memory device which has an array of non-volatile memory cells. The array of non-volatile memory cells is susceptible to suffering loss of data stored in one or more memory cells of the array. The controller interfaces with a host device and receives from the host device a time-stamp signal. The controller comprises a processor, and a memory having program code stored therein for execution by the processor. The program code is configured to receive by the controller the time stamp signal from the host device; to compare the received time stamp signal with a stored signal wherein the stored signal is a time stamp signal received earlier in time by the controller from the host device; and to determine when to perform a data retention and refresh operation for data stored in the memory array based upon the comparing step.

Greek Yogurt Making Device

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US Patent:
20170251685, Sep 7, 2017
Filed:
Mar 3, 2017
Appl. No.:
15/449806
Inventors:
Fong Lin - Glendale CA, US
International Classification:
A23C 9/12
A23C 9/123
Abstract:
A device for making Greek yogurt from traditional yogurt is disclosed. The device includes an outer bowl and an inner strainer that nests within and rotates relative to the outer bowl. At least a portion of the inner strainer is perforated. The device also includes a removable inner lid that that covers and seals the inner strainer when placed thereon. The inner lid rotates with the inner strainer when positioned thereon. The inner lid also includes a first engagement structure for engaging a corresponding second engagement structure of a drive assembly. The device also includes an outer lid that encloses the inner strainer and inner lid within the outer bowl when positioned thereon.
Fong H Lin from San Gabriel, CA, age ~65 Get Report